dc.citation.conferencePlace |
KO |
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dc.citation.conferencePlace |
Gwangju |
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dc.citation.title |
Optoelectronic Materials and Devices |
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dc.citation.volume |
6352 I |
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dc.contributor.author |
Chung, Il-Sug |
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dc.contributor.author |
Choi, Jin-Kyung |
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dc.contributor.author |
Chang, Ki-Soo |
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dc.contributor.author |
Alameh, Kamal |
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dc.contributor.author |
Lee, Yong Tak |
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dc.date.accessioned |
2023-12-20T05:08:06Z |
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dc.date.available |
2023-12-20T05:08:06Z |
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dc.date.created |
2018-02-27 |
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dc.date.issued |
2006-09-05 |
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dc.description.abstract |
Intracavity-contacted resonant cavity enhanced photodetectors (IC RCEPDs) have been fabricated for monolithic integration with IC VCSELs. A low parasitic capacitance of 0.39 pF and an extrinsic 3-dB bandwidth of 9 GHz are demonstrated by using coplanar metal contacts. Optimization issues on device and epi designs are discussed. The largest frequency saturation photocurrent below which the extrinsic 3-dB bandwidth exceeds 6.5 GHz is 4.2 μA. |
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dc.identifier.bibliographicCitation |
Optoelectronic Materials and Devices, v.6352 I |
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dc.identifier.doi |
10.1117/12.691608 |
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dc.identifier.scopusid |
2-s2.0-33845669020 |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/37439 |
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dc.identifier.url |
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/6352/1/Intracavity-contacted-resonant-cavity-enhanced-photodetectors-based-on-VCSEL-structure/10.1117/12.691608.full |
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dc.language |
영어 |
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dc.publisher |
Optoelectronic Materials and Devices |
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dc.title |
Intracavity-contacted resonant cavity enhanced photodetectors based on VCSEL structure |
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dc.type |
Conference Paper |
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dc.date.conferenceDate |
2006-09-05 |
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