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노삼혁

Noh, Sam H.
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dc.citation.conferencePlace KO -
dc.citation.conferencePlace Daegu -
dc.citation.endPage 173 -
dc.citation.startPage 162 -
dc.citation.title 3rd International Conference on Embedded Software and Systems (ICESS 2007) -
dc.citation.volume 4523 -
dc.contributor.author Baek, Seungjae -
dc.contributor.author Choi, Jongmoo -
dc.contributor.author Lee, Donghee -
dc.contributor.author Noh, Sam H. -
dc.date.accessioned 2023-12-20T05:06:16Z -
dc.date.available 2023-12-20T05:06:16Z -
dc.date.created 2016-09-27 -
dc.date.issued 2007-05-14 -
dc.description.abstract In this paper, we propose a model to identify the cost of block cleaning of Flash memory. The model defines three performance parameters, namely, utilization, invalidity, and uniformity and presents a formula for estimating the block cleaning cost based on these parameters. Then, we design a new modification-aware (MODA) page allocation scheme which can improve the block cleaning cost by enhancing uniformity of Flash memory. Real implementation experiments conducted on an embedded system show that the MODA scheme can reduce block cleaning time by up to 43 seconds (with an average of 10.2 seconds) compared to the traditional sequential allocation scheme that is used in YAFFS. -
dc.identifier.bibliographicCitation 3rd International Conference on Embedded Software and Systems (ICESS 2007), v.4523, pp.162 - 173 -
dc.identifier.isbn 3540726845 -
dc.identifier.issn 0302-9743 -
dc.identifier.scopusid 2-s2.0-38749121793 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/37436 -
dc.identifier.url http://link.springer.com/chapter/10.1007%2F978-3-540-72685-2_16 -
dc.language 영어 -
dc.publisher ICESS 2007 -
dc.title Performance characteristics of flash memory: Model and implications -
dc.type Conference Paper -
dc.date.conferenceDate 2007-05-14 -

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