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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.endPage | 574 | - |
| dc.citation.startPage | 568 | - |
| dc.citation.title | 54th Electronic Components and Technology Conference | - |
| dc.contributor.author | Kim, J | - |
| dc.contributor.author | Rotaru, MD | - |
| dc.contributor.author | Chong, KC | - |
| dc.contributor.author | Park, J | - |
| dc.contributor.author | Iyer, MK | - |
| dc.contributor.author | Kim, J | - |
| dc.date.accessioned | 2023-12-20T05:39:56Z | - |
| dc.date.available | 2023-12-20T05:39:56Z | - |
| dc.date.created | 2013-07-17 | - |
| dc.date.issued | 2004-06-01 | - |
| dc.description.abstract | An analytical model of the coupling mechanism between the switching noises to signal traces has been successfully derived. The coupling mechanism was been rigorously analyzed and clarified. The analytical model was verified up to 10GHz by comparison with measured results and simulated results using a full wave simulator (HFSS). It has also been successfully applied to applications like the current memory modules (SDRAM DDR module). | - |
| dc.identifier.bibliographicCitation | 54th Electronic Components and Technology Conference, pp.568 - 574 | - |
| dc.identifier.issn | 0569-5503 | - |
| dc.identifier.scopusid | 2-s2.0-10444284142 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/35834 | - |
| dc.language | 영어 | - |
| dc.publisher | 54th Electronic Components and Technology Conference | - |
| dc.title | Coupling of simultaneous switching noise to interconnecting lines in high-speed systems | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2004-06-01 | - |
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