File Download

There are no files associated with this item.

  • Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
Related Researcher

노삼혁

Noh, Sam H.
Read More

Views & Downloads

Detailed Information

Cited time in webofscience Cited time in scopus
Metadata Downloads

Full metadata record

DC Field Value Language
dc.citation.conferencePlace KO -
dc.citation.conferencePlace Seoul -
dc.citation.endPage 1196 -
dc.citation.startPage 1192 -
dc.citation.title 2007 ACM Symposium on Applied Computing -
dc.contributor.author Kim, Sung-Kwan -
dc.contributor.author Choi, Jongmoo -
dc.contributor.author Lee, Donghee -
dc.contributor.author Noh, Sam H. -
dc.contributor.author Min, Sang Lyul -
dc.date.accessioned 2023-12-20T05:06:40Z -
dc.date.available 2023-12-20T05:06:40Z -
dc.date.created 2016-10-05 -
dc.date.issued 2007-03-11 -
dc.description.abstract System software development and testing on embedded systems can be quite difficult and time consuming. In this paper, we propose a cost effective method, namely virtual testing framework that can be used easily to test the reliability of system software. The framework consists of three layers; virtual platform layer, system software layer, and test environment layer. The virtual platform layer emulates a variety of embedded hardware on which any system software can be run and is used to verify its capability in handling faults injected by the test environment layer. We use the framework to verify the reliability of the file system and FTL (flash translation layer) by injecting faults that may be found in Flash memory. We discuss experimental results that we gained using this framework to gather post-fault behavior of the system software of interest. -
dc.identifier.bibliographicCitation 2007 ACM Symposium on Applied Computing, pp.1192 - 1196 -
dc.identifier.doi 10.1145/1244002.1244260 -
dc.identifier.scopusid 2-s2.0-35248848760 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/35806 -
dc.identifier.url http://dl.acm.org/citation.cfm?id=1244260 -
dc.language 영어 -
dc.publisher 2007 ACM Symposium on Applied Computing -
dc.title Virtual Framework for Testing the Reliability of System Software on Embedded Systems -
dc.type Conference Paper -
dc.date.conferenceDate 2007-03-11 -

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.