dc.citation.conferencePlace |
US |
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dc.citation.conferencePlace |
Colorado Springs, Colorado |
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dc.citation.endPage |
IW1B.3.3 |
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dc.citation.startPage |
IW1B.3.1 |
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dc.citation.title |
Integrated Photonics Research, Silicon and Nanophotonics, IPRSN 2012 |
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dc.contributor.author |
Kwon, Min-Suk |
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dc.contributor.author |
Shin, Jin-Soo |
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dc.contributor.author |
Shin, Sang-Yung |
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dc.date.accessioned |
2023-12-20T02:06:49Z |
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dc.date.available |
2023-12-20T02:06:49Z |
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dc.date.created |
2014-01-14 |
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dc.date.issued |
2012-06-17 |
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dc.description.abstract |
Metal-insulator-silicon-insulator-metal waveguides are experimentally investigated. Their fabrication process is explained, and their measured characteristics are discussed. Their measured propagation loss is 0.262 (0.219) dB/μm when the width of silicon is ~156 (~183) nm. |
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dc.identifier.bibliographicCitation |
Integrated Photonics Research, Silicon and Nanophotonics, IPRSN 2012, pp.IW1B.3.1 - IW1B.3.3 |
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dc.identifier.scopusid |
2-s2.0-85088758796 |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/35699 |
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dc.language |
영어 |
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dc.publisher |
Integrated Photonics Research, Silicon and Nanophotonics, IPRSN 2012 |
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dc.title |
Experimental investigation of CMOS-compatible metal-insulator-silicon-insulator-metal waveguides |
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dc.type |
Conference Paper |
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dc.date.conferenceDate |
2012-06-17 |
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