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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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dc.citation.conferencePlace US -
dc.citation.conferencePlace San Jose -
dc.citation.endPage 6 -
dc.citation.startPage 3 -
dc.citation.title 2015 IEEE Conference on Electrical Performance of Electronic Packaging and Systems -
dc.contributor.author Lee, Manho -
dc.contributor.author Kim, Heegon -
dc.contributor.author Kim, Sukjin -
dc.contributor.author Kim, Joungho -
dc.contributor.author Cho, Jonghyun -
dc.contributor.author Yoon, Changwook -
dc.contributor.author Achkir, Brice -
dc.contributor.author Kim, Jingook -
dc.contributor.author Fan, Jun -
dc.date.accessioned 2023-12-19T21:39:14Z -
dc.date.available 2023-12-19T21:39:14Z -
dc.date.created 2016-01-11 -
dc.date.issued 2015-10-25 -
dc.description.abstract By applying on-chip linear VRM, PDN inductance is greatly decreased and PDN resonance peak disappears, which is usually generated by PCB/PKG inductance and on-chip capacitance. To confirm, we design an application circuits which have on-chip linear voltage regulator module (VRM) with aggressor and victim buffer. We validate the advantages of on-chip linear VRM by measuring fabricated chip in this research. Moreover, we show PDN self-impedance at output buffer by simulation with designed PCB's S-parameter, and eye-diagram power fluctuation up to 1 Gbps. -
dc.identifier.bibliographicCitation 2015 IEEE Conference on Electrical Performance of Electronic Packaging and Systems, pp.3 - 6 -
dc.identifier.doi 10.1109/EPEPS.2015.7347117 -
dc.identifier.scopusid 2-s2.0-84962786477 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/35473 -
dc.identifier.url http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7347117 -
dc.language 영어 -
dc.publisher IEEE -
dc.title Design of On-Chip Linear Voltage Regulator Module And Measurement of Power Distribution Network Noise Fluctuation at High-Speed Output Buffer -
dc.type Conference Paper -
dc.date.conferenceDate 2015-10-25 -

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