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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | CC | - |
| dc.citation.conferencePlace | Shenzhen | - |
| dc.citation.endPage | 607 | - |
| dc.citation.startPage | 605 | - |
| dc.citation.title | 7th Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2016 | - |
| dc.contributor.author | Kwak, Kyungjin | - |
| dc.contributor.author | Shin, Dongil | - |
| dc.contributor.author | Kim, Jingook | - |
| dc.contributor.author | Kim, Jaehyuk | - |
| dc.date.accessioned | 2023-12-19T20:39:32Z | - |
| dc.date.available | 2023-12-19T20:39:32Z | - |
| dc.date.created | 2016-09-12 | - |
| dc.date.issued | 2016-05-17 | - |
| dc.description.abstract | Electromagnetic noise source of an integrated circuit (IC) can be approximately modeled with three dipole moments. To improve the previous dipole moments extraction method using 3 TEM cell measurements data, a new dipole moments extraction technique using 24 measurements data in a GTEM cell is proposed herein. The nonlinear least square (NLS) method is applied to accurately extract the three dipole moments including the relative phases of each dipole moment. The near-magnetic field patterns calculated using the improved dipole moments extraction method are compared with those using the previous method. | - |
| dc.identifier.bibliographicCitation | 7th Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2016, pp.605 - 607 | - |
| dc.identifier.doi | 10.1109/APEMC.2016.7522810 | - |
| dc.identifier.scopusid | 2-s2.0-84983638269 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/35414 | - |
| dc.identifier.url | http://ieeexplore.ieee.org/document/7522810/?arnumber=7522810 | - |
| dc.language | 영어 | - |
| dc.publisher | APEMC 2016 | - |
| dc.title | Dipole-moment model including phases for IC near-field analysis based on GTEM cell measurements | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2016-05-17 | - |
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