File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | Seoul | - |
| dc.citation.endPage | 72 | - |
| dc.citation.startPage | 70 | - |
| dc.citation.title | 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2017 | - |
| dc.contributor.author | Park, Junsik | - |
| dc.contributor.author | Lee, Jongsung | - |
| dc.contributor.author | Jo, Cheolgu | - |
| dc.contributor.author | Seol, Byongsu | - |
| dc.contributor.author | Kim, Jingook | - |
| dc.date.accessioned | 2023-12-19T18:40:20Z | - |
| dc.date.available | 2023-12-19T18:40:20Z | - |
| dc.date.created | 2017-07-11 | - |
| dc.date.issued | 2017-06-21 | - |
| dc.description.abstract | The system-level ESD noises induced by a secondary discharge at voltage suppressor devices in a mobile product are measured and analyzed. Two kinds of voltage suppressor devices, voltage clamping-type and snapback-type devices, are characterized using TLP measurements. The voltage waveforms at the voltage suppressor devices and the power-ground decoupling capacitors are measured and analyzed according to several kinds of voltage suppressor devices. | - |
| dc.identifier.bibliographicCitation | 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2017, pp.70 - 72 | - |
| dc.identifier.doi | 10.1109/APEMC.2017.7975427 | - |
| dc.identifier.scopusid | 2-s2.0-85027548012 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/35296 | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/7975427 | - |
| dc.language | 영어 | - |
| dc.publisher | Asia-Pacific International Symposium on Electromagnetic Compatibility | - |
| dc.title | System-level ESD Noise induced by Secondary Discharges at Voltage Suppressor Devices in a Mobile Product | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2017-06-20 | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.