dc.citation.conferencePlace |
US |
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dc.citation.conferencePlace |
Irvine MarriotIrvine |
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dc.citation.endPage |
518 |
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dc.citation.startPage |
512 |
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dc.citation.title |
36th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2017 |
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dc.contributor.author |
Woo, Mingyu |
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dc.contributor.author |
Kim, Seungwon |
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dc.contributor.author |
Kang, Seokhyeong |
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dc.date.accessioned |
2023-12-19T17:41:33Z |
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dc.date.available |
2023-12-19T17:41:33Z |
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dc.date.created |
2019-03-21 |
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dc.date.issued |
2017-11-13 |
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dc.description.abstract |
Layout pattern classification has been recently utilized in IC design. It clusters hotspot patterns for design-space analysis or yield optimization. In pattern classification, an optimal clustering is essential, as well as its runtime and accuracy. Within the research-oriented infrastructure used in the ICCAD 2016 contest, we have developed a fast metaheuristic for the pattern classification that utilizes the Greedy Randomized Adaptive Search Procedure (GRASP). Our proposed metaheuristic outperforms the best-reported results on all of the ICCAD 2016 benchmarks. In addition, we achieve up to a 50% cluster count reduction, and improve a runtime significantly compared to a commercial EDA tool provided in the ICCAD 2016 contest [1]. |
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dc.identifier.bibliographicCitation |
36th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2017, pp.512 - 518 |
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dc.identifier.doi |
10.1109/ICCAD.2017.8203820 |
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dc.identifier.issn |
1092-3152 |
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dc.identifier.scopusid |
2-s2.0-85043535562 |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/35083 |
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dc.identifier.url |
https://ieeexplore.ieee.org/document/8203820 |
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dc.language |
영어 |
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dc.publisher |
Institute of Electrical and Electronics Engineers Inc. |
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dc.title |
GRASP based metaheuristics for layout pattern classification |
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dc.type |
Conference Paper |
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dc.date.conferenceDate |
2017-11-13 |
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