dc.citation.conferencePlace |
KO |
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dc.citation.conferencePlace |
Daejeon |
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dc.citation.endPage |
73 |
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dc.citation.startPage |
69 |
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dc.citation.title |
23rd IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 |
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dc.contributor.author |
Lee, Jaemin |
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dc.contributor.author |
Kim, Seungwon |
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dc.contributor.author |
Kim, Youngmin |
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dc.contributor.author |
Kang, Seokhyeong |
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dc.date.accessioned |
2023-12-19T22:06:07Z |
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dc.date.available |
2023-12-19T22:06:07Z |
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dc.date.created |
2019-03-25 |
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dc.date.issued |
2015-10-05 |
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dc.description.abstract |
For applications related to human, such as Internet of Things (IoT) and wearable devices, near threshold voltage (NTV) technology has been proposed for the trade-off between performance and energy consumption. However, error-resilient techniques are required in the circuits to improve reliability of the NTV operation. In this paper, we propose a low-overhead error-resilient system and a design flow for NTV operations. We use a new monitoring circuit, which can detect timing errors and find an optimal operation point of the system. Also, we propose two different methodologies, which are slack-based methodology and sensitivity-based methodology. From the proposed monitoring system and the sensitivitybased sorting algorithm, benchmark results show that the optimal designs provide up to 46% monitoring area reduction maintaining similar error detection ability of the conventional error-resilient design. |
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dc.identifier.bibliographicCitation |
23rd IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, pp.69 - 73 |
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dc.identifier.doi |
10.1109/VLSI-SoC.2015.7314394 |
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dc.identifier.issn |
2324-8432 |
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dc.identifier.scopusid |
2-s2.0-84960080664 |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/34972 |
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dc.identifier.url |
https://ieeexplore.ieee.org/document/7314394 |
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dc.language |
영어 |
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dc.publisher |
IEEE Computer Society |
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dc.title |
An optimal operating point by using error monitoring circuits with an error-resilient technique |
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dc.type |
Conference Paper |
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dc.date.conferenceDate |
2015-10-05 |
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