dc.citation.conferencePlace |
JA |
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dc.citation.conferencePlace |
Kyoto |
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dc.citation.endPage |
93 |
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dc.citation.startPage |
92 |
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dc.citation.title |
IEEE Symposium on VLSI Circuits |
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dc.contributor.author |
Kim, Seong-Jin |
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dc.contributor.author |
Kim, James D. K. |
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dc.contributor.author |
Han, Sang-Wook |
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dc.contributor.author |
Kang, Byongmin |
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dc.contributor.author |
Lee, Keechang |
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dc.contributor.author |
Kim, Chang-Yeong |
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dc.date.accessioned |
2023-12-20T03:06:21Z |
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dc.date.available |
2023-12-20T03:06:21Z |
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dc.date.created |
2015-07-16 |
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dc.date.issued |
2011-06-15 |
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dc.description.abstract |
A 3D image sensor is presented employing a time multiplexed concept for color and depth image acquisition in a single chip to generate a real-time 3D image of an arbitrary scene. The pixel adopts a split photodiode to demodulate time-of-flight signals effectively. Every four pixels share two storages and readout transistors to utilize 100% of photons and increase the sensitivity of infrared light by simple binning operation at the expense of resolution. With the fabricated prototype sensor, 640×480 color and depth images of the scenes 1-3m away are captured with an accuracy of 1-6cm. |
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dc.identifier.bibliographicCitation |
IEEE Symposium on VLSI Circuits, pp.92 - 93 |
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dc.identifier.issn |
2158-5601 |
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dc.identifier.scopusid |
2-s2.0-80052667349 |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/32422 |
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dc.identifier.url |
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5986400&refinements%3D4229940942%26filter%3DAND%28p_IS_Number%3A5985982%29 |
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dc.language |
영어 |
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dc.publisher |
IEEE |
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dc.title |
A 640x480 Image Sensor with Unified Pixel Architecture for 2D/3D Imaging in 0.11μm CMOS |
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dc.type |
Conference Paper |
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dc.date.conferenceDate |
2011-06-13 |
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