dc.citation.conferencePlace |
SI |
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dc.citation.conferencePlace |
Marina Bay Sands Singapore |
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dc.citation.endPage |
411 |
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dc.citation.startPage |
408 |
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dc.citation.title |
14th International Symposium on Integrated Circuits, ISIC 2014 |
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dc.contributor.author |
Kim, Seong-Jin |
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dc.contributor.author |
Ng, Simon Sheung Yan |
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dc.contributor.author |
Wee, David |
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dc.contributor.author |
Leow, Yoon Hwee |
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dc.contributor.author |
Ma, Fan-Yung |
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dc.contributor.author |
Chiang, Sie Boo |
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dc.date.accessioned |
2023-12-19T23:06:38Z |
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dc.date.available |
2023-12-19T23:06:38Z |
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dc.date.created |
2015-07-16 |
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dc.date.issued |
2014-12-12 |
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dc.description.abstract |
This paper presents the design of a BJT-based remote temperature sensor to measure ambient temperature in different locations. The sensor chip supplies a calibrated current to the external devices, which are common off-the-shelf bipolar junction transistors - 2N3904 (NPN) and 2N3906 (PNP), and converts their base-emitter voltages to temperature using a 13-bit charge-balancing ΣΔ modulator. Dynamic element matching, correlated double sampling and system-level chopping techniques are deployed to reduce temperature errors due to non-ideal effects of CMOS readout circuitry. A prototype sensor has been fabricated using 0.13-μm CMOS process. Measurement results show that the temperature sensor inaccuracy is ±2 °C from -40 °C to 125 °C. |
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dc.identifier.bibliographicCitation |
14th International Symposium on Integrated Circuits, ISIC 2014, pp.408 - 411 |
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dc.identifier.doi |
10.1109/ISICIR.2014.7029477 |
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dc.identifier.scopusid |
2-s2.0-84924337690 |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/32417 |
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dc.identifier.url |
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=7029477 |
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dc.language |
영어 |
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dc.publisher |
14th International Symposium on Integrated Circuits, ISIC 2014 |
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dc.title |
High Accuracy Remote Temperature Sensor Based on BJT Devices in 0.13-μm CMOS |
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dc.type |
Conference Paper |
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dc.date.conferenceDate |
2014-12-10 |
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