Full metadata record
DC Field | Value | Language |
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dc.citation.endPage | 118004 | - |
dc.citation.startPage | 117997 | - |
dc.citation.title | IEEE ACCESS | - |
dc.citation.volume | 8 | - |
dc.contributor.author | Bae, Byungjin | - |
dc.contributor.author | Kim, Jingook | - |
dc.contributor.author | Han, Ki Jin | - |
dc.date.accessioned | 2023-12-21T17:36:38Z | - |
dc.date.available | 2023-12-21T17:36:38Z | - |
dc.date.created | 2020-06-08 | - |
dc.date.issued | 2020-06 | - |
dc.description.abstract | For the accurate and reliable multi-port characterization of vertical interconnection array structures, this paper presents an indirect-contact probing method to obtain network parameters of Nport device-under-tests (DUTs) using an M-port (N > M) vector network analyzer (VNA) with a dielectric contactor. By utilizing the dielectric contactor as auxiliary loads for un-probed ports for vertical interconnections, multiple M-port sub-array network parameters can be correctly synthesized into the Nport network parameters through the renormalization processes. To verify the proposed method, four-port DUTs for packaging and microwave applications were characterized with two-port indirect-contact probing sub-array simulations including the dielectric contactor. Compared with two-port direct-contact probing simulations without the dielectric contactor, it was confirmed that the proposed method with the dielectric contactor provides improved accuracy in terms of the feature selective validation (FSV) method. | - |
dc.identifier.bibliographicCitation | IEEE ACCESS, v.8, pp.117997 - 118004 | - |
dc.identifier.doi | 10.1109/ACCESS.2020.3003231 | - |
dc.identifier.issn | 2169-3536 | - |
dc.identifier.scopusid | 2-s2.0-85087798875 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/32322 | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/9119390 | - |
dc.identifier.wosid | 000549116900001 | - |
dc.language | 영어 | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | Numerical Verification of Dielectric Contactor as Auxiliary Loads for Measuring the Multi-Port Network Parameter of Vertical Interconnection Array | - |
dc.type | Article | - |
dc.description.isOpenAccess | TRUE | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | Dielectric contactor | - |
dc.subject.keywordAuthor | de-embedding | - |
dc.subject.keywordAuthor | multi-port network | - |
dc.subject.keywordAuthor | port impedance | - |
dc.subject.keywordAuthor | renormalization | - |
dc.subject.keywordAuthor | termination load | - |
dc.subject.keywordAuthor | vertical interconnection | - |
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