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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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dc.citation.endPage 1545 -
dc.citation.number 4 -
dc.citation.startPage 1534 -
dc.citation.title IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY -
dc.citation.volume 62 -
dc.contributor.author Sun, Yin -
dc.contributor.author Kim, Jingook -
dc.contributor.author Ouyang, Muqi -
dc.contributor.author Hwang, Chulsoon -
dc.date.accessioned 2023-12-21T17:11:31Z -
dc.date.available 2023-12-21T17:11:31Z -
dc.date.created 2020-06-07 -
dc.date.issued 2020-08 -
dc.description.abstract In this article, an improved target impedance concept directly correlating circuit output jitter with power distribution network (PDN) R-L-C parameters is proposed. A systematic procedure to develop the target impedance curves is formulated and developed for common CMOS buffer circuits. The relationship between output jitter and PDN R-L-C parameters is analytically derived by evaluating the time domain voltage ripple to jitter transfer relationship along with the relationship between time domain voltage ripple and PDN R-L-C parameters. Given the transient integrated circuit switching current and the jitter specification, multiple target impedance curves can be defined for a specific circuit. The jitter and PDN R-L-C analytical correlations are validated through HSPICE simulation. The application of the proposed target impedance concept with jitter specification is also demonstrated via simulation. -
dc.identifier.bibliographicCitation IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.62, no.4, pp.1534 - 1545 -
dc.identifier.doi 10.1109/TEMC.2020.2996430 -
dc.identifier.issn 0018-9375 -
dc.identifier.scopusid 2-s2.0-85089941189 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/32317 -
dc.identifier.url https://ieeexplore.ieee.org/document/9109550 -
dc.identifier.wosid 000560360900062 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title Improved Target Impedance Concept With Jitter Specification -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Telecommunications -
dc.relation.journalResearchArea Engineering; Telecommunications -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Jitter -
dc.subject.keywordAuthor Impedance -
dc.subject.keywordAuthor Time-domain analysis -
dc.subject.keywordAuthor Switches -
dc.subject.keywordAuthor Propagation delay -
dc.subject.keywordAuthor Transfer functions -
dc.subject.keywordAuthor Integrated circuits -
dc.subject.keywordAuthor Buffer -
dc.subject.keywordAuthor jitter -
dc.subject.keywordAuthor jitter transfer function -
dc.subject.keywordAuthor power supply induced jitter -
dc.subject.keywordAuthor target impedance -
dc.subject.keywordPlus POWER -
dc.subject.keywordPlus DESIGN -

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