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Lee, Jun Hee
Quantum Materials for Energy Conversion Lab.
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dc.citation.endPage 750 -
dc.citation.number 6 -
dc.citation.startPage 746 -
dc.citation.title CURRENT APPLIED PHYSICS -
dc.citation.volume 20 -
dc.contributor.author Choi, J. C. -
dc.contributor.author Song, M. S. -
dc.contributor.author Lee, K. -
dc.contributor.author Park, K. -
dc.contributor.author Park, J. -
dc.contributor.author Lee, H. -
dc.contributor.author Lee, Jun Hee -
dc.contributor.author Chae, S. C. -
dc.date.accessioned 2023-12-21T17:36:45Z -
dc.date.available 2023-12-21T17:36:45Z -
dc.date.created 2020-05-19 -
dc.date.issued 2020-06 -
dc.description.abstract We report on the nonlinear wake-up behavior against the external electric field cycling in the ferroelectric Hf0.7Zr0.3O2 thin film. Two distinct scaling regimes during the increase of the remnant polarization with different activation energies were observed in TiN/Hf0.7Zr0.3O2/TiN cells. The transmission electron microscopy revealed the structural phase transition from the monoclinic structure to the orthorhombic structure of the Hf0.7Zr0.3O2 film after the wake-up behavior. During the phase change, as the remnant polarization enhanced, the dielectric constant of the Hf0.7Zr0.3O2 film increased with the external field cycling. The temperature dependence of the wake-up behavior revealed that each estimated activation energies for the early and later enhancement of the remnant polarization are 1.12 eV and 0.73 eV, respectively. First principle calculations show that the oxygen vacancies can reduce the activation energy barrier for the structural phase transition. -
dc.identifier.bibliographicCitation CURRENT APPLIED PHYSICS, v.20, no.6, pp.746 - 750 -
dc.identifier.doi 10.1016/j.cap.2020.03.012 -
dc.identifier.issn 1567-1739 -
dc.identifier.scopusid 2-s2.0-85082395551 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/32141 -
dc.identifier.url https://www.sciencedirect.com/science/article/pii/S1567173920300663?via%3Dihub -
dc.identifier.wosid 000528929600002 -
dc.language 영어 -
dc.publisher ELSEVIER -
dc.title Dynamic analysis of non-linear wake-up behavior in Hf0.7Zr0.3O2 thin film -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Materials Science, Multidisciplinary; Physics, Applied -
dc.relation.journalResearchArea Materials Science; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.description.journalRegisteredClass kci -
dc.subject.keywordAuthor Hf1-xZrxO2 -
dc.subject.keywordAuthor Ferroelectricity -
dc.subject.keywordAuthor Wake-up effect -
dc.subject.keywordPlus FIELD-CYCLING BEHAVIOR -
dc.subject.keywordPlus MECHANISMS -

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