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- Lee, Jaiyong
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.endPage | 1223 | - |
| dc.citation.number | 12 | - |
| dc.citation.startPage | 1213 | - |
| dc.citation.title | COMPUTER COMMUNICATIONS | - |
| dc.citation.volume | 24 | - |
| dc.contributor.author | Hwang, I | - |
| dc.contributor.author | Kim, T | - |
| dc.contributor.author | Hong, S | - |
| dc.contributor.author | Lee, J | - |
| dc.date.accessioned | 2023-12-22T11:43:20Z | - |
| dc.date.available | 2023-12-22T11:43:20Z | - |
| dc.date.created | 2020-05-12 | - |
| dc.date.issued | 2001-07 | - |
| dc.description.abstract | In testing Nondeterministic Finite State Machines (NFSMs), testing process becomes hypothesis testing, if test sequence repetition numbers are not large enough to satisfy the so-called complete-testing assumption. In this paper, we present a method to determine the repetition numbers of test sequences assuming that each transition is executed with a fixed probability when nondeterministic choice is made. The proposed method ensures the test pass probability of restricted class of faulty machines to be never greater than a given value. Also, we discuss how to select a test suite for NFSMs that guarantees the minimal total test length. (C) 2001 Elsevier Science B.V. All rights reserved. | - |
| dc.identifier.bibliographicCitation | COMPUTER COMMUNICATIONS, v.24, no.12, pp.1213 - 1223 | - |
| dc.identifier.doi | 10.1016/S0140-3664(00)00327-3 | - |
| dc.identifier.issn | 0140-3664 | - |
| dc.identifier.scopusid | 2-s2.0-0035879462 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/32122 | - |
| dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0140366400003273?via%3Dihub | - |
| dc.identifier.wosid | 000169974200008 | - |
| dc.language | 영어 | - |
| dc.publisher | ELSEVIER SCIENCE BV | - |
| dc.title | Test selection for a nondeterministic FSM | - |
| dc.type | Article | - |
| dc.description.isOpenAccess | FALSE | - |
| dc.relation.journalWebOfScienceCategory | Computer Science, Information Systems; Engineering, Electrical & Electronic; Telecommunications | - |
| dc.relation.journalResearchArea | Computer Science; Engineering; Telecommunications | - |
| dc.type.docType | Article | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordAuthor | Nondeterministric Finite-State Machines | - |
| dc.subject.keywordAuthor | protocol conformance testing | - |
| dc.subject.keywordAuthor | software testing | - |
| dc.subject.keywordAuthor | minimal test length | - |
| dc.subject.keywordPlus | FINITE-STATE MACHINES | - |
| dc.subject.keywordPlus | FAULT COVERAGE | - |
| dc.subject.keywordPlus | GENERATION | - |
| dc.subject.keywordPlus | MODELS | - |
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