There are no files associated with this item.
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 1732 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 1724 | - |
dc.citation.title | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | - |
dc.citation.volume | 62 | - |
dc.contributor.author | Kwak, Kyungjin | - |
dc.contributor.author | Bae, Tae-il | - |
dc.contributor.author | Hong, Kichul | - |
dc.contributor.author | Kim, Hyungsoo | - |
dc.contributor.author | Kim, Jingook | - |
dc.date.accessioned | 2023-12-21T17:43:43Z | - |
dc.date.available | 2023-12-21T17:43:43Z | - |
dc.date.created | 2020-02-20 | - |
dc.date.issued | 2020-04 | - |
dc.description.abstract | The accuracy of equivalent dipole arrays for source modeling of electromagnetic fields is affected by several factors. In the step for extracting equivalent dipole arrays for a given source, there are three factors that can affect accuracy: scanning height, source spacing, and scanning gap. In the evaluation step of reconstructed fields, there are two other factors that can also affect accuracy: evaluation height and additional structures. In this paper, simple guidelines are suggested considering the three factors in extracting equivalent dipole arrays. Also, the effects of the evaluation height on accuracy of reconstructed fields are demonstrated in the presence of shielding or dielectric structures. A feature selective validation process was utilized to evaluate similarities between actual and estimated fields. | - |
dc.identifier.bibliographicCitation | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.62, no.4, pp.1724 - 1732 | - |
dc.identifier.doi | 10.1002/mop.32223 | - |
dc.identifier.issn | 0895-2477 | - |
dc.identifier.scopusid | 2-s2.0-85077896336 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/31244 | - |
dc.identifier.url | https://onlinelibrary.wiley.com/doi/full/10.1002/mop.32223 | - |
dc.identifier.wosid | 000517561100041 | - |
dc.language | 영어 | - |
dc.publisher | John Wiley and Sons Inc. | - |
dc.title | Accuracy investigation of equivalent dipole arrays for near-field estimation in presence of shielding or dielectric structures | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic; Optics | - |
dc.relation.journalResearchArea | Engineering; Optics | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | dielectric layer | - |
dc.subject.keywordAuthor | equivalent dipole array | - |
dc.subject.keywordAuthor | evaluation height | - |
dc.subject.keywordAuthor | feature selective validation | - |
dc.subject.keywordAuthor | near-field estimation | - |
dc.subject.keywordAuthor | scanning gap | - |
dc.subject.keywordAuthor | scanning height | - |
dc.subject.keywordAuthor | shielding box | - |
dc.subject.keywordAuthor | source spacing | - |
dc.subject.keywordPlus | COMPUTATIONAL ELECTROMAGNETICS CEM | - |
dc.subject.keywordPlus | SELECTIVE VALIDATION FSV | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Tel : 052-217-1404 / Email : scholarworks@unist.ac.kr
Copyright (c) 2023 by UNIST LIBRARY. All rights reserved.
ScholarWorks@UNIST was established as an OAK Project for the National Library of Korea.