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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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dc.citation.endPage 1732 -
dc.citation.number 4 -
dc.citation.startPage 1724 -
dc.citation.title MICROWAVE AND OPTICAL TECHNOLOGY LETTERS -
dc.citation.volume 62 -
dc.contributor.author Kwak, Kyungjin -
dc.contributor.author Bae, Tae-il -
dc.contributor.author Hong, Kichul -
dc.contributor.author Kim, Hyungsoo -
dc.contributor.author Kim, Jingook -
dc.date.accessioned 2023-12-21T17:43:43Z -
dc.date.available 2023-12-21T17:43:43Z -
dc.date.created 2020-02-20 -
dc.date.issued 2020-04 -
dc.description.abstract The accuracy of equivalent dipole arrays for source modeling of electromagnetic fields is affected by several factors. In the step for extracting equivalent dipole arrays for a given source, there are three factors that can affect accuracy: scanning height, source spacing, and scanning gap. In the evaluation step of reconstructed fields, there are two other factors that can also affect accuracy: evaluation height and additional structures. In this paper, simple guidelines are suggested considering the three factors in extracting equivalent dipole arrays. Also, the effects of the evaluation height on accuracy of reconstructed fields are demonstrated in the presence of shielding or dielectric structures. A feature selective validation process was utilized to evaluate similarities between actual and estimated fields. -
dc.identifier.bibliographicCitation MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.62, no.4, pp.1724 - 1732 -
dc.identifier.doi 10.1002/mop.32223 -
dc.identifier.issn 0895-2477 -
dc.identifier.scopusid 2-s2.0-85077896336 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/31244 -
dc.identifier.url https://onlinelibrary.wiley.com/doi/full/10.1002/mop.32223 -
dc.identifier.wosid 000517561100041 -
dc.language 영어 -
dc.publisher John Wiley and Sons Inc. -
dc.title Accuracy investigation of equivalent dipole arrays for near-field estimation in presence of shielding or dielectric structures -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Optics -
dc.relation.journalResearchArea Engineering; Optics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor dielectric layer -
dc.subject.keywordAuthor equivalent dipole array -
dc.subject.keywordAuthor evaluation height -
dc.subject.keywordAuthor feature selective validation -
dc.subject.keywordAuthor near-field estimation -
dc.subject.keywordAuthor scanning gap -
dc.subject.keywordAuthor scanning height -
dc.subject.keywordAuthor shielding box -
dc.subject.keywordAuthor source spacing -
dc.subject.keywordPlus COMPUTATIONAL ELECTROMAGNETICS CEM -
dc.subject.keywordPlus SELECTIVE VALIDATION FSV -

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