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dc.citation.endPage 2078 -
dc.citation.number 9 -
dc.citation.startPage 2070 -
dc.citation.title ELECTROANALYSIS -
dc.citation.volume 23 -
dc.contributor.author Chang, Byoung-Yong -
dc.contributor.author Lee, Hyo Joong -
dc.contributor.author Park, Su-Moon -
dc.date.accessioned 2023-12-22T06:06:18Z -
dc.date.available 2023-12-22T06:06:18Z -
dc.date.created 2013-06-12 -
dc.date.issued 2011-09 -
dc.description.abstract We report an extraction-reconstruction strategy for obtaining a novel voltammogram for a specific electrochemical process. While a conventional voltammogram is obtained from potentiodynamic currents, our voltammogram is obtained from a large body of potentiodynamic electrochemical impedance spectra by taking advantage of their highly resolvable power. As a proof of concept, construction of a mass transfer admittance voltammogram (MTAV) is demonstrated, which is made up of purely mass transfer admittances plotted vs. potential, excluding effects from other interfering electrochemical components. We also compare the MTAV with the AC voltammogram to show its enhanced accuracy and apply the novel voltammetry to clearly determine the number of electrons transferred and diffusion coefficients, which may vary depending on experimental conditions, for a complex electrochemical reaction. -
dc.identifier.bibliographicCitation ELECTROANALYSIS, v.23, no.9, pp.2070 - 2078 -
dc.identifier.doi 10.1002/elan.201100173 -
dc.identifier.issn 1040-0397 -
dc.identifier.scopusid 2-s2.0-80052241187 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/3121 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=80052241187 -
dc.identifier.wosid 000295143900011 -
dc.language 영어 -
dc.publisher WILEY-BLACKWELL -
dc.title Mass-Transfer Admittance Voltammetry from Electrochemical Impedance Spectroscopy and Its Applications -
dc.type Article -
dc.relation.journalWebOfScienceCategory Chemistry, Analytical; Electrochemistry -
dc.relation.journalResearchArea Chemistry; Electrochemistry -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Mass transfer admittance voltammogram -
dc.subject.keywordAuthor Impedance -
dc.subject.keywordAuthor Fourier transform -

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