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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 291 | - |
dc.citation.startPage | 281 | - |
dc.citation.title | JOURNAL OF APPLIED CRYSTALLOGRAPHY | - |
dc.citation.volume | 41 | - |
dc.contributor.author | Heo, Kyuyoung | - |
dc.contributor.author | Yoon, Jinhwan | - |
dc.contributor.author | Jin, Sangwoo | - |
dc.contributor.author | Kim, Jehan | - |
dc.contributor.author | Kim, Kwang-Woo | - |
dc.contributor.author | Shin, Tae Joo | - |
dc.contributor.author | Chung, Bonghoon | - |
dc.contributor.author | Chang, Taihyun | - |
dc.contributor.author | Ree, Moonhor | - |
dc.date.accessioned | 2023-12-22T08:41:05Z | - |
dc.date.available | 2023-12-22T08:41:05Z | - |
dc.date.created | 2020-01-23 | - |
dc.date.issued | 2008-04 | - |
dc.description.abstract | Grazing-incidence X-ray scattering (GIXS) formulas for hexagonally perforated layer (HPL) structures with ABC and AB stacking sequences were derived, and used in the quantitative analysis of the two-dimensional GIXS patterns of polystyrene-b-polyisoprene (PS-b-PI) diblock copolymer thin films supported on silicon substrates. This quantitative analysis provided detailed information ( shape, size and size distribution, packing order, layer packing sequence, and orientation) about the HPL structure of the diblock copolymer films that cannot be easily obtained with conventional X-ray and neutron scattering techniques or with conventional microscopic methods. | - |
dc.identifier.bibliographicCitation | JOURNAL OF APPLIED CRYSTALLOGRAPHY, v.41, pp.281 - 291 | - |
dc.identifier.doi | 10.1107/S0021889808001271 | - |
dc.identifier.issn | 0021-8898 | - |
dc.identifier.scopusid | 2-s2.0-40849136139 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/30897 | - |
dc.identifier.url | http://scripts.iucr.org/cgi-bin/paper?S0021889808001271 | - |
dc.identifier.wosid | 000253992700006 | - |
dc.language | 영어 | - |
dc.publisher | INT UNION CRYSTALLOGRAPHY | - |
dc.title | Polystyrene-b-polyisoprene thin films with hexagonally perforated layer structure: quantitative grazing-incidence X-ray scattering analysis | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary; Crystallography | - |
dc.relation.journalResearchArea | Chemistry; Crystallography | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | ORGANOSILICATE DIELECTRIC FILMS | - |
dc.subject.keywordPlus | CUBIC LATTICE SYSTEMS | - |
dc.subject.keywordPlus | DIBLOCK COPOLYMERS | - |
dc.subject.keywordPlus | ELASTIC-SCATTERING | - |
dc.subject.keywordPlus | ORDERED PHASES | - |
dc.subject.keywordPlus | NANOPORES | - |
dc.subject.keywordPlus | REFLECTIVITY | - |
dc.subject.keywordPlus | MECHANISM | - |
dc.subject.keywordPlus | BEHAVIOR | - |
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