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Lee, Jun Hee
Quantum Materials for Energy Conversion Lab.
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dc.citation.endPage 38936 -
dc.citation.number 42 -
dc.citation.startPage 38929 -
dc.citation.title ACS APPLIED MATERIALS & INTERFACES -
dc.citation.volume 11 -
dc.contributor.author Lee, Kyoungjun -
dc.contributor.author Lee, Hyun-Jae -
dc.contributor.author Lee, Tae Yoon -
dc.contributor.author Lim, Hong Heon -
dc.contributor.author Song, Myeonl Seop -
dc.contributor.author Yoo, Hyang Keun -
dc.contributor.author Suh, Dong Ik -
dc.contributor.author Lee, Jae Gil -
dc.contributor.author Zhu, Zhongwei -
dc.contributor.author Yoon, Alexander -
dc.contributor.author MacDonald, Matthew R. -
dc.contributor.author Lei, Xinjian -
dc.contributor.author Park, Kunwoo -
dc.contributor.author Park, Jungwon -
dc.contributor.author Lee, Jun Hee -
dc.contributor.author Chae, Seung Chul -
dc.date.accessioned 2023-12-21T18:38:14Z -
dc.date.available 2023-12-21T18:38:14Z -
dc.date.created 2019-11-19 -
dc.date.issued 2019-10 -
dc.description.abstract The recent demand for analogue devices for neuromorphic applications requires modulation of multiple nonvolatile states. Ferroelectricity with multiple polarization states enables neuromorphic applications with various architectures. However, deterministic control of ferroelectric polarization states with conventional ferroelectric materials has been met with accessibility issues. Here, we report unprecedented stable accessibility with robust stability of multiple polarization states in ferroelectric HfO2. Through the combination of conventional voltage measurements, hysteresis temperature dependence analysis, piezoelectric force microscopy, first-principles calculations, and Monte Carlo simulations, we suggest that the unprecedented stability of intermediate states in ferroelectric HfO2 is due to the small critical volume size for nucleation and the large activation energy for ferroelectric dipole flipping. This work demonstrates the potential of ferroelectric HfO2 for analogue device applications enabling neuromorphic computing. -
dc.identifier.bibliographicCitation ACS APPLIED MATERIALS & INTERFACES, v.11, no.42, pp.38929 - 38936 -
dc.identifier.doi 10.1021/acsami.9b12878 -
dc.identifier.issn 1944-8244 -
dc.identifier.scopusid 2-s2.0-85073195489 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/30785 -
dc.identifier.url https://pubs.acs.org/doi/10.1021/acsami.9b12878 -
dc.identifier.wosid 000492802100059 -
dc.language 영어 -
dc.publisher AMER CHEMICAL SOC -
dc.title Stable Subloop Behavior in Ferroelectric Si-Doped HfO2 -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Nanoscience & Nanotechnology; Materials Science, Multidisciplinary -
dc.relation.journalResearchArea Science & Technology - Other Topics; Materials Science -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor FeRAM -
dc.subject.keywordAuthor ferroelectric -
dc.subject.keywordAuthor multilevel -
dc.subject.keywordAuthor analogue device -
dc.subject.keywordAuthor HfO2 -
dc.subject.keywordPlus RETENTION LOSS -
dc.subject.keywordPlus DYNAMICS -
dc.subject.keywordPlus MECHANISMS -
dc.subject.keywordPlus FIELD -

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