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권영남

Kwon, Young-Nam
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dc.citation.endPage 132 -
dc.citation.number 1-2 -
dc.citation.startPage 117 -
dc.citation.title JOURNAL OF MEMBRANE SCIENCE -
dc.citation.volume 340 -
dc.contributor.author Wong, Philip Chuen Yung -
dc.contributor.author Kwon, Young-Nam -
dc.contributor.author Criddle, Craig S. -
dc.date.accessioned 2023-12-22T07:41:01Z -
dc.date.available 2023-12-22T07:41:01Z -
dc.date.created 2013-06-07 -
dc.date.issued 2009-09 -
dc.description.abstract Membrane surface roughness alters the surface area accessible to foulants and may influence macroscopic properties, such as zeta potential. it is usually quantified by atomic force microscopy (AFM) at a single scan size. This would be appropriate if roughness is independent of scale. This study shows that the root-mean-square roughness, R(RMS), is scale (or scan size, L x L) dependent through the power law R(RMS) =AL(3-D). The coefficient, A, is the roughness at a scan size of 1(2) mu m(2). D is the fractal dimension that relates the increase in roughness to the increase in scan size. Values for A and D were determined for a range of micro- and ultrafiltration membranes using an AFM scan series covering at least three orders of magnitude in L. They were also determined for nanofiltration membranes by re-analysis of data in the literature. The results suggest that using the power law expression allows potentially greater discrimination among membrane types and provides a way to quantify membrane roughness over a range of scales. It was further observed that the coefficients A and D of PVDF membranes showed positive and negative correlations, respectively, with the molecular weight cut-off. Additionally, zeta potentials of PVDF membranes measured by the tangential streaming potential method became more negative with increasing A and more positive with increasing D, suggesting possible significant influence of roughness on hydrodynamic transport of ions. -
dc.identifier.bibliographicCitation JOURNAL OF MEMBRANE SCIENCE, v.340, no.1-2, pp.117 - 132 -
dc.identifier.doi 10.1016/j.memsci.2009.05.018 -
dc.identifier.issn 0376-7388 -
dc.identifier.scopusid 2-s2.0-67649354027 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/3049 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=67649354027 -
dc.identifier.wosid 000268346900013 -
dc.language 영어 -
dc.publisher ELSEVIER SCIENCE BV -
dc.title Use of atomic force microscopy and fractal geometry to characterize the roughness of nano-, micro-, and ultrafiltration membranes -
dc.type Article -
dc.relation.journalWebOfScienceCategory Engineering, Chemical; Polymer Science -
dc.relation.journalResearchArea Engineering; Polymer Science -
dc.description.journalRegisteredClass scopus -

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