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Kim, Guntae
Research Interests
  • Solid Oxide Fuel Cells (SOFCs)& SOE, PEMFC, metal-air batteries, Metal-CO2 system, Catalyst for DRM


Oxidation-reduction behavior of La0.8Sr0.2ScyMn1-yO3 +/-delta (y=0.2, 0.3, 0.4): Defect structure, thermodynamic and electrical properties

DC Field Value Language Sengodan, Sivaprakash ko Ahn, Sunghoo ko Shin, Jeeyoung ko Kim, Guntae ko 2014-04-10T01:18:29Z - 2013-06-11 ko 2012-11 -
dc.identifier.citation SOLID STATE IONICS, v.228, no., pp.25 - ko
dc.identifier.issn 0167-2738 ko
dc.identifier.uri -
dc.identifier.uri ko
dc.description.abstract Oxygen non-stoichiometry ofLa(0.8)Sr(0.2)Sc(y)Mn(1-y)O(3 +/-delta) (y = 0.2, 0.3, 0.4) oxide was studied by coulometric titration as a function of oxygen partial pressure, p(O-2), and temperature in a range of 923-1023 K. Depending on the Sc doping amount, p(O-2), and temperature, oxygen non-stoichiometry varies significantly. Under a reducing condition, La0.8Sr0.2ScyMn1-yO3 +/-delta shows both oxygen excess and oxygen deficient compositions. At the higher p(O-2) region, the oxygen excess composition is due to metal ion vacancies, whereas in the lower p(O-2) region, the oxygen deficient composition is due to the formation of oxygen vacancies. The experimental data were analyzed by a random defect model. Partial molar enthalpy and partial molar entropy of oxygen vacancy formation are calculated using the Gibbs-Helmholtz equation from the non-stoichiometric data. The electrical conductivity was measured as the function of the oxygen partial pressure and temperature. In the lower p(O-2) region, electrical conductivity strongly depends on the oxygen non-stoichiometry. ko
dc.description.statementofresponsibility close -
dc.language ENG ko
dc.publisher ELSEVIER SCIENCE BV ko
dc.subject Coulometric titration ko
dc.subject Defect chemistry ko
dc.subject Electrical conductivity ko
dc.subject Intermediate temperature solid oxide fuel cell ko
dc.subject Oxygen non-stoichiometry ko
dc.title Oxidation-reduction behavior of La0.8Sr0.2ScyMn1-yO3 +/-delta (y=0.2, 0.3, 0.4): Defect structure, thermodynamic and electrical properties ko
dc.type ARTICLE ko
dc.identifier.scopusid 2-s2.0-84866784149 ko
dc.identifier.wosid 000312522800005 ko
dc.type.rims ART ko
dc.description.wostc 0 *
dc.description.scopustc 0 * 2015-02-28 * 2014-07-12 *
dc.identifier.doi 10.1016/j.ssi.2012.09.004 ko
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