dc.citation.endPage |
222 |
- |
dc.citation.number |
4 |
- |
dc.citation.startPage |
218 |
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dc.citation.title |
APPLIED MICROSCOPY |
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dc.citation.volume |
42 |
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dc.contributor.author |
Ryu, Gyeong Hee |
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dc.contributor.author |
Park, Hyo Ju |
- |
dc.contributor.author |
Kim, Na Yeon |
- |
dc.contributor.author |
Lee, Zonghoon |
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dc.date.accessioned |
2023-12-22T04:36:46Z |
- |
dc.date.available |
2023-12-22T04:36:46Z |
- |
dc.date.created |
2014-01-24 |
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dc.date.issued |
2012-12 |
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dc.description.abstract |
Modern aberration-corrected transmission electron microscope (TEM) with appropriate electron beam energy is able to achieve atomic resolution imaging of single and bilayer graphene sheets. Especially, atomic configuration of bilayer graphene with a rotation angle can be identified from the direct imaging and phase reconstructed imaging since atomic resolution Moir pattern can be obtained successfully at atomic scale using an aberration-corrected TEM. This study boosts a reliable stacking order analysis, which is required for synthesized or artificially prepared multilayer graphene, and lets graphene researchers utilize the information of atomic configuration of stacked graphene layers readily. |
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dc.identifier.bibliographicCitation |
APPLIED MICROSCOPY, v.42, no.4, pp.218 - 222 |
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dc.identifier.doi |
10.9729/AM.2012.42.4.218 |
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dc.identifier.issn |
2287-5123 |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/2851 |
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dc.language |
영어 |
- |
dc.publisher |
한국현미경학회 |
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dc.title |
Atomic Resolution Imaging of Rotated Bilayer Graphene Sheets Using a Low kV Aberration-corrected Transmission Electron Microscope |
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dc.type |
Article |
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dc.description.isOpenAccess |
TRUE |
- |
dc.identifier.kciid |
ART001721911 |
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dc.description.journalRegisteredClass |
kci |
- |