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Lee, Zonghoon
Atomic-Scale Electron Microscopy (ASEM) Lab
Research Interests
  • Advanced Transmission Electron Microscopy (TEM/STEM), in Situ TEM, graphene, 2D materials, low-dimensional crystals, nanostructured materials

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Atomic Resolution Imaging of Rotated Bilayer Graphene Sheets Using a Low kV Aberration-corrected Transmission Electron Microscope

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dc.contributor.author Ryu, Gyeong Hee ko
dc.contributor.author Park, Hyo Ju ko
dc.contributor.author Kim, Na Yeon ko
dc.contributor.author Lee, Zonghoon ko
dc.date.available 2014-04-10T00:25:59Z -
dc.date.created 2014-01-24 ko
dc.date.issued 2012-12 ko
dc.identifier.citation APPLIED MICROSCOPY, v.42, no.4, pp.218 - 222 ko
dc.identifier.issn 2287-5123 ko
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/2851 -
dc.description.abstract Modern aberration-corrected transmission electron microscope (TEM) with appropriate electron beam energy is able to achieve atomic resolution imaging of single and bilayer graphene sheets. Especially, atomic configuration of bilayer graphene with a rotation angle can be identified from the direct imaging and phase reconstructed imaging since atomic resolution Moir pattern can be obtained successfully at atomic scale using an aberration-corrected TEM. This study boosts a reliable stacking order analysis, which is required for synthesized or artificially prepared multilayer graphene, and lets graphene researchers utilize the information of atomic configuration of stacked graphene layers readily. ko
dc.description.statementofresponsibility open -
dc.language 영어 ko
dc.publisher 한국현미경학회 ko
dc.title Atomic Resolution Imaging of Rotated Bilayer Graphene Sheets Using a Low kV Aberration-corrected Transmission Electron Microscope ko
dc.type ARTICLE ko
dc.type.rims ART ko
dc.identifier.doi 10.9729/AM.2012.42.4.218 ko
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