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정홍식

Jeong, Hongsik
Future Semiconductor Technology Lab.
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dc.citation.endPage H141 -
dc.citation.number 3 -
dc.citation.startPage H139 -
dc.citation.title JOURNAL OF THE ELECTROCHEMICAL SOCIETY -
dc.citation.volume 154 -
dc.contributor.author Park, Jong-Bong -
dc.contributor.author Park, Gyeong-Su -
dc.contributor.author Baik, Hion-Suck -
dc.contributor.author Lee, Jang-Ho -
dc.contributor.author Jeong, Hongsik -
dc.contributor.author Kim, Kinam -
dc.date.accessioned 2023-12-22T09:37:16Z -
dc.date.available 2023-12-22T09:37:16Z -
dc.date.created 2019-07-11 -
dc.date.issued 2007-01 -
dc.description.abstract We observed the atomic structures for each reset and set state in a phase-change random access memory fabricated using stoichiometric crystalline Ge2Sb2Te5. The reset state clearly showed a mixture of dome-shaped amorphous and crystal structure surrounding amorphous, but the set state showed abnormally grown large grains due to recrystallization of the amorphous structure. The crystal structure of the recrystallized grain was face-centered cubic. The element analysis indicated that the atomic composition changes to nonstoichiometric phase in the active regions of the reset and the set state, which is Sb-rich and Te-deficient compared to the pristine stoichiometric composition. Analysis showed that thermal interdiffusion of Sb and Te caused nonstoichiometric nature of the material to reach the energetically stable state in the active region. -
dc.identifier.bibliographicCitation JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.154, no.3, pp.H139 - H141 -
dc.identifier.doi 10.1149/1.2409482 -
dc.identifier.issn 0013-4651 -
dc.identifier.scopusid 2-s2.0-33846954042 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/27156 -
dc.identifier.url http://jes.ecsdl.org/content/154/3/H139 -
dc.identifier.wosid 000243977500059 -
dc.language 영어 -
dc.publisher ELECTROCHEMICAL SOC INC -
dc.title Phase-change behavior of stoichiometric Ge2Sb2Te5 in phase-change random access memory -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Electrochemistry; Materials Science, Coatings & Films -
dc.relation.journalResearchArea Electrochemistry; Materials Science -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus THIN-FILMS -
dc.subject.keywordPlus MEDIA -

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