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DC Field | Value | Language |
---|---|---|
dc.citation.number | 4 | - |
dc.citation.startPage | 04DD14 | - |
dc.citation.title | JAPANESE JOURNAL OF APPLIED PHYSICS | - |
dc.citation.volume | 51 | - |
dc.contributor.author | Ryoo, Kyung-Chang | - |
dc.contributor.author | Oh, Jeong-Hoon | - |
dc.contributor.author | Jung, Sunghun | - |
dc.contributor.author | Jeong, Hongsik | - |
dc.contributor.author | Park, Byung-Gook | - |
dc.date.accessioned | 2023-12-22T05:11:31Z | - |
dc.date.available | 2023-12-22T05:11:31Z | - |
dc.date.created | 2019-07-11 | - |
dc.date.issued | 2012-04 | - |
dc.description.abstract | A new technical improvement in understanding the resistive switching characteristics of unipolar resistive random access memory (RRAM) is investigated. It is possible to minimize reset current (I-RESET), set voltage variation, and forming voltage (V-FORMING), which results in a wide sensing margin and high density applications by using a conducting filament (CF) minimized structure up to a 10 nm technology node. Its structural advantages enable I-RESET to be tuned with excellent manufacturability. Numerical simulation is also performed using a random circuit breaker (RCB) model, showing that the proposed structure elucidates the resistive switching improvement. | - |
dc.identifier.bibliographicCitation | JAPANESE JOURNAL OF APPLIED PHYSICS, v.51, no.4, pp.04DD14 | - |
dc.identifier.doi | 10.1143/JJAP.51.04DD14 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.scopusid | 2-s2.0-84860378392 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/27139 | - |
dc.identifier.url | https://iopscience.iop.org/article/10.1143/JJAP.51.04DD14 | - |
dc.identifier.wosid | 000303928600037 | - |
dc.language | 영어 | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.title | Areal and Structural Effects on Oxide-Based Resistive Random Access Memory Cell for Improving Resistive Switching Characteristics | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | TRANSITION-METAL OXIDES | - |
dc.subject.keywordPlus | NONVOLATILE MEMORY | - |
dc.subject.keywordPlus | RESISTANCE | - |
dc.subject.keywordPlus | DEVICES | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordPlus | MODEL | - |
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