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정홍식

Jeong, Hongsik
Future Semiconductor Technology Lab.
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dc.citation.endPage 21827 -
dc.citation.number 39 -
dc.citation.startPage 21819 -
dc.citation.title ACS APPLIED MATERIALS & INTERFACES -
dc.citation.volume 7 -
dc.contributor.author Park, Sungjin -
dc.contributor.author Park, Dambi -
dc.contributor.author Jeong, Kwangsik -
dc.contributor.author Kirn, Taeok -
dc.contributor.author Park, SeungJong -
dc.contributor.author Ahn, Min -
dc.contributor.author Yang, Won Jun -
dc.contributor.author Han, Jeong Hwa -
dc.contributor.author Jeong, Hong Sik -
dc.contributor.author Jeon, Seong Gi -
dc.contributor.author Song, Jae Yong -
dc.contributor.author Cho, Mann-Ho -
dc.date.accessioned 2023-12-22T00:38:37Z -
dc.date.available 2023-12-22T00:38:37Z -
dc.date.created 2019-07-11 -
dc.date.issued 2015-10 -
dc.description.abstract The thermal conduction characteristics of GeTe and Ge2Sb2Te5(GST) nanowires were investigated using an optical method to determine the local temperature by Raman spectroscopy. Since the localization of surface charge in a single-crystalline nanostructure can enhance charge-phonon scattering, the thermal conductivity value (kappa) of single crystalline GeTe and GST nanowires was decreased significantly to 1.44 Wm(-1) K-1 for GeTe and 1.13 Wm(-1) K-1 for GST, compared to reported values for polycrystalline structures. The SET-to-RESET state in single-crystalline GeTe and GST nanowires are characteristic of a memory device. Unlike previous reports using GeTe and GST nanowires, the SET-to-RESET characteristics showed a bipolar switching shape and no unipolar switching. In addition, after multiple cycles of operation, a significant change in morphology and composition was observed without any structural phase transition, indicating that atoms migrate toward the cathode or anode, depending on their electronegativities. This change caused by a field effect indicates that the structural phase transition does not occur in the case of GeTe and GST nanowires with a significantly lowered thermal conductivity and stable crystalline structure. Finally, the formation of voids and hillocks as the result of the electromigration critically degrades device reliability. -
dc.identifier.bibliographicCitation ACS APPLIED MATERIALS & INTERFACES, v.7, no.39, pp.21819 - 21827 -
dc.identifier.doi 10.1021/acsami.5b05703 -
dc.identifier.issn 1944-8244 -
dc.identifier.scopusid 2-s2.0-84944096209 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/27130 -
dc.identifier.url https://pubs.acs.org/doi/10.1021/acsami.5b05703 -
dc.identifier.wosid 000362628900026 -
dc.language 영어 -
dc.publisher AMER CHEMICAL SOC -
dc.title Effect of the Thermal Conductivity on Resistive Switching in GeTe and Ge2Sb2Te5 Nanowires -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Nanoscience & Nanotechnology; Materials Science, Multidisciplinary -
dc.relation.journalResearchArea Science & Technology - Other Topics; Materials Science -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Ge2Sb2Te5 -
dc.subject.keywordAuthor GeTe -
dc.subject.keywordAuthor phase-change memory -
dc.subject.keywordAuthor thermal conductivity -
dc.subject.keywordAuthor bipolar switching property -
dc.subject.keywordPlus PHASE-CHANGE MEMORY -
dc.subject.keywordPlus ELECTROMIGRATION -
dc.subject.keywordPlus GRAPHENE -
dc.subject.keywordPlus AMORPHIZATION -

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