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Suh, Joonki
Semiconductor Nanotechnology Lab.
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dc.citation.endPage 2400 -
dc.citation.number 5 -
dc.citation.startPage 2394 -
dc.citation.title NANO LETTERS -
dc.citation.volume 14 -
dc.contributor.author Favaloro, Tela -
dc.contributor.author Suh, Joonki -
dc.contributor.author Vermeersch, Bjorn -
dc.contributor.author Liu, Kai -
dc.contributor.author Gu, Yijia -
dc.contributor.author Chen, Long-Qing -
dc.contributor.author Wang, Kevin X. -
dc.contributor.author Wu, Junqiao -
dc.contributor.author Shakouri, Ali -
dc.date.accessioned 2023-12-22T02:39:55Z -
dc.date.available 2023-12-22T02:39:55Z -
dc.date.created 2019-07-17 -
dc.date.issued 2014-05 -
dc.description.abstract The metal to insulator transition (MIT) of strongly correlated materials is subject to strong lattice coupling, which brings about the unique one-dimensional alignment of metal insulator (M-I) domains along nanowires or nanobeams. Many studies have investigated the effects of stress on the MIT and hence the phase boundary, but few have directly examined the temperature profile across the metal insulating interface. Here, we use thermoreflectance microscopy to create two-dimensional temperature maps of single-crystalline VO2 nanobeams under external bias in the phase coexisting regime. We directly observe highly localized alternating Peltier heating and cooling as well as Joule heating concentrated at the M I domain boundaries, indicating the significance of the domain walls and band offsets. Utilizing the thermoreflectance technique, we are able to elucidate strain accumulation along the nanobeam and distinguish between two insulating phases of VO2 through detection of the opposite polarity of their respective thermoreflectance coefficients. Microelasticity theory was employed to predict favorable domain wall configurations, confirming the monoclinic phase identification. -
dc.identifier.bibliographicCitation NANO LETTERS, v.14, no.5, pp.2394 - 2400 -
dc.identifier.doi 10.1021/nl500042x -
dc.identifier.issn 1530-6984 -
dc.identifier.scopusid 2-s2.0-84900502169 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/27105 -
dc.identifier.url https://pubs.acs.org/doi/10.1021/nl500042x -
dc.identifier.wosid 000336074800024 -
dc.language 영어 -
dc.publisher AMER CHEMICAL SOC -
dc.title Direct Observation of Nanoscale Peltier and Joule Effects at Metal-Insulator Domain Walls in Vanadium Dioxide Nanobeams -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter -
dc.relation.journalResearchArea Chemistry; Science & Technology - Other Topics; Materials Science; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Vanadium dioxide -
dc.subject.keywordAuthor thermoreflectance microscopy -
dc.subject.keywordAuthor Peltier effect -
dc.subject.keywordAuthor Joule heating -
dc.subject.keywordAuthor metal-insulator domain wall -
dc.subject.keywordPlus PHASE-TRANSITION -
dc.subject.keywordPlus VO2 -
dc.subject.keywordPlus ORGANIZATION -
dc.subject.keywordPlus TEMPERATURE -
dc.subject.keywordPlus RESOLUTION -
dc.subject.keywordPlus NANOWIRES -
dc.subject.keywordPlus STRESS -
dc.subject.keywordPlus M2 -

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