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Lee, Zonghoon
Atomic-Scale Electron Microscopy (ASEM) Lab
Research Interests
  • Advanced Transmission Electron Microscopy (TEM/STEM), in Situ TEM, graphene, 2D materials, low-dimensional crystals, nanostructured materials

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Dedicated preparation for in situ transmission electron microscope tensile testing of exfoliated graphene

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Title
Dedicated preparation for in situ transmission electron microscope tensile testing of exfoliated graphene
Author
Kim, KangsikYoon, Jong ChanKim, JaeminKim, Jung HwaLee, Suk WooYoon, AramLee, Zonghoon
Issue Date
2019-04
Publisher
한국현미경학회
Citation
Applied Microscopy, v.49, pp.3
Abstract
Graphene, which is one of the most promising materials for its state-of-the-art applications, has received extensive attention because of its superior mechanical properties. However, there is little experimental evidence related to the mechanical properties of graphene at the atomic level because of the challenges associated with transferring atomically-thin two-dimensional (2D) materials onto microelectromechanical systems (MEMS) devices. In this study, we show successful dry transfer with a gel material of a stable, clean, and free-standing exfoliated graphene film onto a push-to-pull (PTP) device, which is a MEMS device used for uniaxial tensile testing in in situ transmission electron microscopy (TEM). Through the results of optical microscopy, Raman spectroscopy, and TEM, we demonstrate high quality exfoliated graphene on the PTP device. Finally, the stress–strain results corresponding to propagating cracks in folded graphene were simultaneously obtained during the tensile tests in TEM. The zigzag and armchair edges of graphene confirmed that the fracture occurred in association with the hexagonal lattice structure of graphene while the tensile testing. In the wake of the results, we envision the dedicated preparation and in situ TEM tensile experiments advance the understanding of the relationship between the mechanical properties and structural characteristics of 2D materials.
URI
https://scholarworks.unist.ac.kr/handle/201301/26904
URL
https://appmicro.springeropen.com/articles/10.1007/s42649-019-0005-5
DOI
10.1007/s42649-019-0005-5
ISSN
2287-4445
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MSE_Journal Papers
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