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Park, Kibog
Emergent Materials & Devices Lab.
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dc.citation.endPage 983 -
dc.citation.number 10 -
dc.citation.startPage 979 -
dc.citation.title JOURNAL OF THE KOREAN PHYSICAL SOCIETY -
dc.citation.volume 74 -
dc.contributor.author Choi, Gahyun -
dc.contributor.author Yoon, Hoon Hahn -
dc.contributor.author Park, Kibog -
dc.contributor.author Kim, Junhyung -
dc.contributor.author Jung, Sungchul -
dc.contributor.author Chong, Yonuk -
dc.date.accessioned 2023-12-21T19:09:47Z -
dc.date.available 2023-12-21T19:09:47Z -
dc.date.created 2019-06-10 -
dc.date.issued 2019-05 -
dc.description.abstract We experimentally demonstrate that metal/oxide/floating-Schottky junction has multiple effective capacitances depending on the amount of electrons stored in the floating metal electrode. The oxide thin film covering the Schottky junction is used to trap electrons in the floating metal. The electron flow into and out of the floating metal is controlled by applying voltage pulses of opposite polarities onto the semiconductor substrate. With the amount of excess charges in the floating metal, the depletion capacitance of Schottky junction varies synchronously, which dominantly affects the effective capacitance of the whole junction. Interestingly, the capacitance of metal/oxide/floating-Schottky junction measured as a function of applied voltage pulse shows a hysteretic behavior, which supports its capacitive memory effect. It is expected that our metal/oxide/floating-Schottky junction can work as a memcapacitor capable of recording multiple switchable capacitance values and it can be readily fabricated with the current Si CMOS technology. -
dc.identifier.bibliographicCitation JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.74, no.10, pp.979 - 983 -
dc.identifier.doi 10.3938/jkps.74.979 -
dc.identifier.issn 0374-4884 -
dc.identifier.scopusid 2-s2.0-85066032658 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/26883 -
dc.identifier.url https://link.springer.com/article/10.3938%2Fjkps.74.979 -
dc.identifier.wosid 000468235800012 -
dc.language 영어 -
dc.publisher KOREAN PHYSICAL SOC -
dc.title Multi-Level Capacitive Memory Effect in Metal/Oxide/Floating-Schottky Junction -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Physics, Multidisciplinary -
dc.identifier.kciid ART002467905 -
dc.relation.journalResearchArea Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.description.journalRegisteredClass kci -
dc.subject.keywordAuthor Multi-level capacitance -
dc.subject.keywordAuthor Schottky junction -
dc.subject.keywordAuthor Floating metal electrode -

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