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- Bae, Sung Chul
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.endPage | 3957 | - |
| dc.citation.number | 10 | - |
| dc.citation.startPage | 3955 | - |
| dc.citation.title | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
| dc.citation.volume | 71 | - |
| dc.contributor.author | Bae, Sung Chul | - |
| dc.contributor.author | Granick, Steve | - |
| dc.date.accessioned | 2023-12-22T12:06:40Z | - |
| dc.date.available | 2023-12-22T12:06:40Z | - |
| dc.date.created | 2019-04-10 | - |
| dc.date.issued | 2000-10 | - |
| dc.description.abstract | A simple interferometric method is described to measure the time-dependent deformation of piezoelectric bimorphs driven by ac voltage. Applying this method to a bimorph assembly used to measure viscoelastic forces in a surface forces apparatus, we find that a sinusoidal-shaped harmonic drive voltage generates sinusoidal deformation but that a triangular-shaped harmonic drive voltage fails to produce triangular-shaped deformation if the drive frequency exceeds 1/100 of the resonance frequency. Sinusoidal displacement amplitudes as small as 0.1 nm were resolved. | - |
| dc.identifier.bibliographicCitation | REVIEW OF SCIENTIFIC INSTRUMENTS, v.71, no.10, pp.3955 - 3957 | - |
| dc.identifier.doi | 10.1063/1.1288233 | - |
| dc.identifier.issn | 0034-6748 | - |
| dc.identifier.scopusid | 2-s2.0-0012681313 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/26502 | - |
| dc.identifier.url | https://aip.scitation.org/doi/abs/10.1063/1.1288233 | - |
| dc.identifier.wosid | 000089554500059 | - |
| dc.language | 영어 | - |
| dc.publisher | AMER INST PHYSICS | - |
| dc.title | Calibration of piezoelectric bimorphs for experiments in a surface forces apparatus | - |
| dc.type | Article | - |
| dc.description.isOpenAccess | FALSE | - |
| dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation; Physics, Applied | - |
| dc.relation.journalResearchArea | Instruments & Instrumentation; Physics | - |
| dc.type.docType | Article | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
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