dc.citation.number |
7 |
- |
dc.citation.startPage |
1603601 |
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dc.citation.title |
ADVANCED MATERIALS |
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dc.citation.volume |
29 |
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dc.contributor.author |
Park, Kyoung-Duck |
- |
dc.contributor.author |
Raschke, Markus B. |
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dc.contributor.author |
Atkin, Joanna M. |
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dc.contributor.author |
Lee, Young Hee |
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dc.contributor.author |
Jeong, Mun Seok |
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dc.date.accessioned |
2023-12-21T22:39:27Z |
- |
dc.date.available |
2023-12-21T22:39:27Z |
- |
dc.date.created |
2018-11-05 |
- |
dc.date.issued |
2017-02 |
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dc.description.abstract |
The bilayer grain boundaries (GBs) in chemical‐vapor‐deposition‐grown large‐area graphene are identified using multispectral tip‐enhanced Raman imaging with 18 nm spatial resolution. The misorientation angle of the bilayer GBs is determined from a quantitative analysis of the phonon‐scattering properties associated with the modified electronic structure. |
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dc.identifier.bibliographicCitation |
ADVANCED MATERIALS, v.29, no.7, pp.1603601 |
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dc.identifier.doi |
10.1002/adma.201603601 |
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dc.identifier.issn |
0935-9648 |
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dc.identifier.scopusid |
2-s2.0-85012937373 |
- |
dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/25120 |
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dc.identifier.url |
https://onlinelibrary.wiley.com/doi/abs/10.1002/adma.201603601 |
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dc.identifier.wosid |
000396144600006 |
- |
dc.language |
영어 |
- |
dc.publisher |
WILEY-V C H VERLAG GMBH |
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dc.title |
Probing Bilayer Grain Boundaries in Large-Area Graphene with Tip-Enhanced Raman Spectroscopy |
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dc.type |
Article |
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dc.description.journalRegisteredClass |
scie |
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dc.description.journalRegisteredClass |
scopus |
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