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김봉수

Kim, BongSoo
Polymer & Organic Semiconductor Lab.
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dc.citation.endPage 4971 -
dc.citation.number 15 -
dc.citation.startPage 4970 -
dc.citation.title JOURNAL OF THE AMERICAN CHEMICAL SOCIETY -
dc.citation.volume 128 -
dc.contributor.author Kim, B -
dc.contributor.author Beebe, JM -
dc.contributor.author Jun, Y -
dc.contributor.author Zhu, XY -
dc.contributor.author Frisbie, CD -
dc.date.accessioned 2023-12-22T10:07:01Z -
dc.date.available 2023-12-22T10:07:01Z -
dc.date.created 2018-09-10 -
dc.date.issued 2006-04 -
dc.description.abstract Understanding electron transport in metal−molecule−metal (MMM) junctions is of great importance for the advancement of molecular electronics. Critical factors that determine conductivity in a MMM junction include the nature of metal−molecule contacts and the electronic structure of the molecular backbone. We have studied the electronic transport property and the valence electronic structure on rigid, conjugated oligoacenes of increasing length with either thiol (−S) or isocyanide (−CN) linkers using conducting probe atomic force microscopy (CP-AFM) and ultraviolet photoelectron spectroscopy (UPS). We find that for these conjugated systems the Au−CN contact is more resistive than Au−S. The difference in contact resistance correlates with UPS measurements that show the highest-occupied molecular orbital (HOMO) of the isocyanide series is lower in energy (relative to the Fermi level of Au) than the HOMO of the thiol series, indicating the presence of a higher tunneling barrier at the contact for the isocyanide-linked molecules. By contrast, the difference in the HOMO positions for the two series of molecules does not appear to affect the length dependence of the junction resistance (i.e., the β value = 0.5 Å-1). -
dc.identifier.bibliographicCitation JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, v.128, no.15, pp.4970 - 4971 -
dc.identifier.doi 10.1021/ja0607990 -
dc.identifier.issn 0002-7863 -
dc.identifier.scopusid 2-s2.0-33646133911 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/24832 -
dc.identifier.url https://pubs.acs.org/doi/abs/10.1021/ja0607990 -
dc.identifier.wosid 000236917200025 -
dc.language 영어 -
dc.publisher AMER CHEMICAL SOC -
dc.title Correlation between HOMO alignment and contact resistance in molecular junctions: Aromatic thiols versus aromatic isocyanides -
dc.type Article -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus ATOMIC-FORCE MICROSCOPY -
dc.subject.keywordPlus METAL WORK FUNCTION -
dc.subject.keywordPlus ELECTRON-TRANSFER -
dc.subject.keywordPlus CONDUCTANCE -
dc.subject.keywordPlus TRANSPORT -
dc.subject.keywordPlus DEPENDENCE -
dc.subject.keywordPlus BRIDGES -
dc.subject.keywordPlus RATES -
dc.subject.keywordPlus WIRES -
dc.subject.keywordPlus SAMS -

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