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dc.citation.endPage 660 -
dc.citation.number 5 -
dc.citation.startPage 645 -
dc.citation.title PLASMA PHYSICS AND CONTROLLED FUSION -
dc.citation.volume 43 -
dc.contributor.author In, Yongkyoon -
dc.contributor.author Hubbard, AE -
dc.contributor.author Hutchinson, IH -
dc.date.accessioned 2023-12-22T11:44:24Z -
dc.date.available 2023-12-22T11:44:24Z -
dc.date.created 2018-03-05 -
dc.date.issued 2001-05 -
dc.description.abstract During 'type III' edge-localized modes (ELMs) on Alcator C-Mod, electron cyclotron emission (ECE) diagnostics show brief signal drops of second harmonic X-mode and signal increases of fundamental harmonic O-mode. These are explained in terms of refraction effects and are found to be useful to infer the associated ELM geometrical dimensions. A new ray tracing code, which can accommodate poloidal variations, has been developed for this investigation. The ELMs are modelled satisfactorily as a density loss from a poloidally elongated region. -
dc.identifier.bibliographicCitation PLASMA PHYSICS AND CONTROLLED FUSION, v.43, no.5, pp.645 - 660 -
dc.identifier.doi 10.1088/0741-3335/43/5/302 -
dc.identifier.issn 0741-3335 -
dc.identifier.scopusid 2-s2.0-0035334022 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/23794 -
dc.identifier.url http://iopscience.iop.org/article/10.1088/0741-3335/43/5/302/meta -
dc.identifier.wosid 000169074400003 -
dc.language 영어 -
dc.publisher IOP PUBLISHING LTD -
dc.title Electron cyclotron emission refraction effects during edge-localized modes -
dc.type Article -
dc.description.journalRegisteredClass scopus -

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