dc.citation.endPage |
660 |
- |
dc.citation.number |
5 |
- |
dc.citation.startPage |
645 |
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dc.citation.title |
PLASMA PHYSICS AND CONTROLLED FUSION |
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dc.citation.volume |
43 |
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dc.contributor.author |
In, Yongkyoon |
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dc.contributor.author |
Hubbard, AE |
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dc.contributor.author |
Hutchinson, IH |
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dc.date.accessioned |
2023-12-22T11:44:24Z |
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dc.date.available |
2023-12-22T11:44:24Z |
- |
dc.date.created |
2018-03-05 |
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dc.date.issued |
2001-05 |
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dc.description.abstract |
During 'type III' edge-localized modes (ELMs) on Alcator C-Mod, electron cyclotron emission (ECE) diagnostics show brief signal drops of second harmonic X-mode and signal increases of fundamental harmonic O-mode. These are explained in terms of refraction effects and are found to be useful to infer the associated ELM geometrical dimensions. A new ray tracing code, which can accommodate poloidal variations, has been developed for this investigation. The ELMs are modelled satisfactorily as a density loss from a poloidally elongated region. |
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dc.identifier.bibliographicCitation |
PLASMA PHYSICS AND CONTROLLED FUSION, v.43, no.5, pp.645 - 660 |
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dc.identifier.doi |
10.1088/0741-3335/43/5/302 |
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dc.identifier.issn |
0741-3335 |
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dc.identifier.scopusid |
2-s2.0-0035334022 |
- |
dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/23794 |
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dc.identifier.url |
http://iopscience.iop.org/article/10.1088/0741-3335/43/5/302/meta |
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dc.identifier.wosid |
000169074400003 |
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dc.language |
영어 |
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dc.publisher |
IOP PUBLISHING LTD |
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dc.title |
Electron cyclotron emission refraction effects during edge-localized modes |
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dc.type |
Article |
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dc.description.journalRegisteredClass |
scopus |
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