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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.endPage | 252 | - |
| dc.citation.number | 4 | - |
| dc.citation.startPage | 251 | - |
| dc.citation.title | APPLIED MICROSCOPY | - |
| dc.citation.volume | 47 | - |
| dc.contributor.author | Lee, Jongyeong | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2023-12-21T21:19:52Z | - |
| dc.date.available | 2023-12-21T21:19:52Z | - |
| dc.date.created | 2018-01-08 | - |
| dc.date.issued | 2017-12 | - |
| dc.identifier.bibliographicCitation | APPLIED MICROSCOPY, v.47, no.4, pp.251 - 252 | - |
| dc.identifier.doi | 10.9729/AM.2017.47.4.251 | - |
| dc.identifier.issn | 2287-5123 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/23193 | - |
| dc.language | 영어 | - |
| dc.publisher | 한국현미경학회지 | - |
| dc.title | The First Transmission Electron Microscope Image Imagined by Artificial Intelligence | - |
| dc.type | Article | - |
| dc.description.isOpenAccess | FALSE | - |
| dc.identifier.kciid | ART002305703 | - |
| dc.description.journalRegisteredClass | kci | - |
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