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| DC Field | Value | Language |
|---|---|---|
| dc.citation.endPage | 5250 | - |
| dc.citation.number | 9A | - |
| dc.citation.startPage | 5247 | - |
| dc.citation.title | JAPANESE JOURNAL OF APPLIED PHYSICS | - |
| dc.citation.volume | 40 | - |
| dc.contributor.author | Hwang, Younghun | - |
| dc.contributor.author | Kim, Hyekyeong | - |
| dc.contributor.author | Chung, Moonsung | - |
| dc.contributor.author | Um, Youngho | - |
| dc.contributor.author | Park, Hyoyeol | - |
| dc.contributor.author | Yoo, Pyoungkil | - |
| dc.date.accessioned | 2023-12-22T11:44:53Z | - |
| dc.date.available | 2023-12-22T11:44:53Z | - |
| dc.date.created | 2017-02-23 | - |
| dc.date.issued | 2001-04 | - |
| dc.description.abstract | Spectroscopic ellipsometry measurements of the complex dielectric function of a series of Cd1-xMnxTe (0 ≤ x ≤ 0.7) films grown on (100) GaAs by hot wall epitaxy have been performed in the 1.5-5.5 eV photon energy range at room temperature. The measured data were analyzed by fitting the second-derivative spectra (d2ε/dω2) with a theoretical model, namely, the standard critical-point (SCP) line shapes. It was found that the SCP model explains the measured derivative spectra successfully. The composition dependence of the critical-point (CP) energies and Lorentzian broadening (Γ) was determined. | - |
| dc.identifier.bibliographicCitation | JAPANESE JOURNAL OF APPLIED PHYSICS, v.40, no.9A, pp.5247 - 5250 | - |
| dc.identifier.issn | 0021-4922 | - |
| dc.identifier.scopusid | 2-s2.0-0035456895 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/21622 | - |
| dc.identifier.url | http://iopscience.iop.org/article/10.1143/JJAP.40.5247/meta;jsessionid=E0EFDA982E1475E7CE188DACB4ADB6FE.c2.iopscience.cld.iop.org | - |
| dc.identifier.wosid | 000171677200010 | - |
| dc.language | 영어 | - |
| dc.publisher | JAPAN SOC APPLIED PHYSICS | - |
| dc.title | Spectroscopic Ellipsometry Studies of Cd1−xMnxTe Films Grown on GaAs | - |
| dc.type | Article | - |
| dc.description.journalRegisteredClass | scopus | - |
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