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DC Field | Value | Language |
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dc.citation.endPage | 1680 | - |
dc.citation.number | 7 | - |
dc.citation.startPage | 1677 | - |
dc.citation.title | PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | - |
dc.citation.volume | 241 | - |
dc.contributor.author | Um, YH | - |
dc.contributor.author | Hwang, Younghun | - |
dc.contributor.author | Peiris, FC | - |
dc.contributor.author | Furdyna, JK | - |
dc.date.accessioned | 2023-12-22T11:06:07Z | - |
dc.date.available | 2023-12-22T11:06:07Z | - |
dc.date.created | 2017-02-23 | - |
dc.date.issued | 2004-06 | - |
dc.description.abstract | We have measured the dependence of the indices of refraction n on alloy composition x of Zn1-xMnxSe films grown by MBE on GaAs (100) substrates for a series of alloy compositions x. The Mn compositions of the films were determined by XRD. A prism coupler technique was used to measure n and thickness of each of the alloy films. On the whole, the indices of refraction n obtained by this method decrease linearly as increasing x showing an inverse relationship with respect to their band gaps, in spite of showing a minimum in the near-band gap energy in the region of 0 less than or equal to x less than or equal to 0.1. We obtained a linear calibration function for n as n = 2.5928 - 0.1486x from the prism coupler technique, which can be used to make an accurate estimate the Mn composition in the Zn1-xMnxSe alloy system if you only measure n. And, the crystalline quality of the Zn1-xMnxSe alloy film was deteriorated showing an exponential dependence of FWHM ratio of alloy layer to GaAs substrate obtained from DCRC as increasing Mn mole fraction. | - |
dc.identifier.bibliographicCitation | PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, v.241, no.7, pp.1677 - 1680 | - |
dc.identifier.doi | 10.1002/pssb.200304640 | - |
dc.identifier.issn | 0370-1972 | - |
dc.identifier.scopusid | 2-s2.0-4644232386 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/21618 | - |
dc.identifier.url | http://onlinelibrary.wiley.com/doi/10.1002/pssb.200304640/abstract | - |
dc.identifier.wosid | 000222123000073 | - |
dc.language | 영어 | - |
dc.publisher | WILEY-V C H VERLAG GMBH | - |
dc.title | Dependence of indices of refraction on Mn composition of Zn1-xMnxSe thin films using prism coupler technique | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.description.journalRegisteredClass | scopus | - |
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