Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.citation.number | 7 | - |
| dc.citation.startPage | 07A946 | - |
| dc.citation.title | JOURNAL OF APPLIED PHYSICS | - |
| dc.citation.volume | 105 | - |
| dc.contributor.author | Hwang, Younghun | - |
| dc.contributor.author | Choi, Jeongyong | - |
| dc.contributor.author | Cho, Sunglae | - |
| dc.contributor.author | Ketterson, John B. | - |
| dc.contributor.author | Tsai, C-C | - |
| dc.date.accessioned | 2023-12-22T08:07:19Z | - |
| dc.date.available | 2023-12-22T08:07:19Z | - |
| dc.date.created | 2017-02-23 | - |
| dc.date.issued | 2009-04 | - |
| dc.description.abstract | We present the structural and magnetic properties of Fe2As thin films grown on Si(100) by molecular beam epitaxy. From the reflection high-energy electron diffraction and x- ray diffraction patterns, the orientation of Fe2As film on Si(100) was found to be a c-axis in the tetragonal crystal structure. The tetragonal Fe2As thin film exhibited ferrimagnetic (FIM) ordering at room temperature. The magnetic moment of Fe2As was 0.1 mu(B)/unit cell determined from the saturated magnetic moment. The observed FIM in Fe2As films was attributed to the strain in the film. (c) 2009 American Institute of Physics. | - |
| dc.identifier.bibliographicCitation | JOURNAL OF APPLIED PHYSICS, v.105, no.7, pp.07A946 | - |
| dc.identifier.doi | 10.1063/1.3068626 | - |
| dc.identifier.issn | 0021-8979 | - |
| dc.identifier.scopusid | 2-s2.0-65249165323 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/21582 | - |
| dc.identifier.url | http://aip.scitation.org/doi/10.1063/1.3068626 | - |
| dc.identifier.wosid | 000266633500271 | - |
| dc.language | 영어 | - |
| dc.publisher | AMER INST PHYSICS | - |
| dc.title | Ferrimagnetism in strained Fe2As thin films on Si(001) | - |
| dc.type | Article | - |
| dc.description.journalRegisteredClass | scopus | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.