dc.citation.endPage |
771 |
- |
dc.citation.number |
7 |
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dc.citation.startPage |
767 |
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dc.citation.title |
NEW PHYSICS: SAE MULLI |
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dc.citation.volume |
60 |
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dc.contributor.author |
Hwang, Younghun |
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dc.contributor.author |
Um, Youngho |
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dc.contributor.author |
Park, Hyo-yeol |
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dc.date.accessioned |
2023-12-22T07:06:50Z |
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dc.date.available |
2023-12-22T07:06:50Z |
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dc.date.created |
2017-02-23 |
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dc.date.issued |
2010-07 |
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dc.description.abstract |
We used spectroscopic ellipsometry to investigate in the energy range of 1.5 ? 5.5 eV at room temperature the dielectric function of Cd1-xMnxTe(0.0 ≤ x ≤0.77) crystals grown using a vertical Bridgman method. The critical point (CP) parameters of the E0, E1,, and E1+△1 structure were determined from an analysis of the numerically-obtained second derivatives of the original pseudodielectric function spectra. The E1 and E1+ △1 energies decreased with increasing Mn composition x due to a hybridization of the valence and the conduction bands in CdTe with Mn 3d levels. The dependence of such CP parameters on the Mn mole fraction x is discussed. |
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dc.identifier.bibliographicCitation |
NEW PHYSICS: SAE MULLI, v.60, no.7, pp.767 - 771 |
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dc.identifier.doi |
10.3938/NPSM.60.767 |
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dc.identifier.issn |
0374-4914 |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/21576 |
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dc.identifier.url |
http://www.npsm-kps.org/journal/view.html?volume=60&number=7&spage=767&year=2010 |
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dc.language |
영어 |
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dc.publisher |
한국물리학회 |
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dc.title |
Studies of Spectroscopic Ellipsometry in Cd1−xMnxTe (0.0< x< 0.77) Single Crystals |
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dc.type |
Article |
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