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dc.citation.endPage 771 -
dc.citation.number 7 -
dc.citation.startPage 767 -
dc.citation.title NEW PHYSICS: SAE MULLI -
dc.citation.volume 60 -
dc.contributor.author Hwang, Younghun -
dc.contributor.author Um, Youngho -
dc.contributor.author Park, Hyo-yeol -
dc.date.accessioned 2023-12-22T07:06:50Z -
dc.date.available 2023-12-22T07:06:50Z -
dc.date.created 2017-02-23 -
dc.date.issued 2010-07 -
dc.description.abstract We used spectroscopic ellipsometry to investigate in the energy range of 1.5 ? 5.5 eV at room temperature the dielectric function of Cd1-xMnxTe(0.0 ≤ x ≤0.77) crystals grown using a vertical Bridgman method. The critical point (CP) parameters of the E0, E1,, and E1+△1 structure were determined from an analysis of the numerically-obtained second derivatives of the original pseudodielectric function spectra. The E1 and E1+ △1 energies decreased with increasing Mn composition x due to a hybridization of the valence and the conduction bands in CdTe with Mn 3d levels. The dependence of such CP parameters on the Mn mole fraction x is discussed. -
dc.identifier.bibliographicCitation NEW PHYSICS: SAE MULLI, v.60, no.7, pp.767 - 771 -
dc.identifier.doi 10.3938/NPSM.60.767 -
dc.identifier.issn 0374-4914 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/21576 -
dc.identifier.url http://www.npsm-kps.org/journal/view.html?volume=60&number=7&spage=767&year=2010 -
dc.language 영어 -
dc.publisher 한국물리학회 -
dc.title Studies of Spectroscopic Ellipsometry in Cd1−xMnxTe (0.0< x< 0.77) Single Crystals -
dc.type Article -

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