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DC Field | Value | Language |
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dc.citation.endPage | 2491 | - |
dc.citation.number | 9 | - |
dc.citation.startPage | 2487 | - |
dc.citation.title | MATERIALS RESEARCH BULLETIN | - |
dc.citation.volume | 47 | - |
dc.contributor.author | Hwang, Younghun | - |
dc.contributor.author | Kim, Hyungmin | - |
dc.contributor.author | Um, Youngho | - |
dc.contributor.author | Park, Hyoyeol | - |
dc.date.accessioned | 2023-12-22T05:11:43Z | - |
dc.date.available | 2023-12-22T05:11:43Z | - |
dc.date.created | 2017-02-23 | - |
dc.date.issued | 2012-04 | - |
dc.description.abstract | We have experimentally investigated the effects of hydrogen-annealing on the structural, electrical, and optical properties of Al-doped ZnO (ZnO:Al) thin films prepared by RF magnetron sputtering at room temperature. From the X-ray diffraction observations, the orientation of ZnO:Al films was found to be a c-axis in the hexagonal structure. We found that intentionally incorporated hydrogen plays an important role in n-type conduction as a donor, improving free carrier concentration and electrical stability. We simultaneously obtained improved optical transmission and enhanced absorption edge of the ZnO:Al film due to hydrogen-annealing. Our experimental data suggest the hydrogen-annealing process as an important role in the enhancement of electrical and optical properties, which is promising as a back reflector material for thin-film solar cells. | - |
dc.identifier.bibliographicCitation | MATERIALS RESEARCH BULLETIN, v.47, no.9, pp.2487 - 2491 | - |
dc.identifier.doi | 10.1016/j.materresbull.2012.05.013 | - |
dc.identifier.issn | 0025-5408 | - |
dc.identifier.scopusid | 2-s2.0-84864601190 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/21423 | - |
dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S0025540812003893 | - |
dc.identifier.wosid | 000309081400059 | - |
dc.language | 영어 | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.title | Optical and electronic properties of highly stable and textured hydrogenated ZnO:Al thin films | - |
dc.type | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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