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dc.citation.number 17 -
dc.citation.startPage 17C306 -
dc.citation.title JOURNAL OF APPLIED PHYSICS -
dc.citation.volume 113 -
dc.contributor.author Shin, Yooleemi -
dc.contributor.author Tuan, Douong Anh -
dc.contributor.author Hwang, Younghun -
dc.contributor.author Cuong, Tran Viet -
dc.contributor.author Cho, Sunglae -
dc.date.accessioned 2023-12-22T04:07:42Z -
dc.date.available 2023-12-22T04:07:42Z -
dc.date.created 2017-02-23 -
dc.date.issued 2013-04 -
dc.description.abstract In this work, the growth and ferromagnetic properties of -FeSi thin film on Si(100) substrate prepared by molecular beam epitaxy are reported. The inter-diffusion of Fe layer on Si(100) substrate at 600 °C results in polycrystalline -FeSi layer. The determined activation energy was 0.044 eV. The modified magnetism from paramagnetic in bulk to ferromagnetic states in -FeSi thin films was observed. The saturated magnetization and coercive field of -FeSi film are 4.6 emu/cm3 and 29 Oe at 300 K, respectively. -
dc.identifier.bibliographicCitation JOURNAL OF APPLIED PHYSICS, v.113, no.17, pp.17C306 -
dc.identifier.doi 10.1063/1.4800839 -
dc.identifier.issn 0021-8979 -
dc.identifier.scopusid 2-s2.0-84877751912 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/21417 -
dc.identifier.url http://aip.scitation.org/doi/10.1063/1.4800839 -
dc.identifier.wosid 000319292800174 -
dc.language 영어 -
dc.publisher AMER INST PHYSICS -
dc.title Formation and ferromagnetic properties of FeSi thin films -
dc.type Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -

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