Full metadata record
DC Field | Value | Language |
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dc.citation.startPage | 38724 | - |
dc.citation.title | SCIENTIFIC REPORTS | - |
dc.citation.volume | 6 | - |
dc.contributor.author | Lee, Hyeon Jun | - |
dc.contributor.author | Lee, Sung Su | - |
dc.contributor.author | Kwak, Jeong Hun | - |
dc.contributor.author | Kim, Young-Min | - |
dc.contributor.author | Jeong, Hu Young | - |
dc.contributor.author | Borisevich, Albina Y. | - |
dc.contributor.author | Lee, Su Yong | - |
dc.contributor.author | Noh, Do Young | - |
dc.contributor.author | Kwon, Owoong | - |
dc.contributor.author | Kim, Yunseok | - |
dc.contributor.author | Jo, Ji Young | - |
dc.date.accessioned | 2023-12-21T22:49:54Z | - |
dc.date.available | 2023-12-21T22:49:54Z | - |
dc.date.created | 2017-01-02 | - |
dc.date.issued | 2016-12 | - |
dc.description.abstract | For epitaxial films, a critical thickness (t(c)) can create a phenomenological interface between a strained bottom layer and a relaxed top layer. Here, we present an experimental report of how the t(c) in BiFeO3 thin films acts as a boundary to determine the crystalline phase, ferroelectricity, and piezoelectricity in 60 nm thick BiFeO3/SrRuO3/SrTiO3 substrate. We found larger Fe cation displacement of the relaxed layer than that of strained layer. In the time-resolved X-ray microdiffraction analyses, the piezoelectric response of the BiFeO3 film was resolved into a strained layer with an extremely low piezoelectric coefficient of 2.4 pm/V and a relaxed layer with a piezoelectric coefficient of 32 pm/V. The difference in the Fe displacements between the strained and relaxed layers is in good agreement with the differences in the piezoelectric coefficient due to the electromechanical coupling | - |
dc.identifier.bibliographicCitation | SCIENTIFIC REPORTS, v.6, pp.38724 | - |
dc.identifier.doi | 10.1038/srep38724 | - |
dc.identifier.issn | 2045-2322 | - |
dc.identifier.scopusid | 2-s2.0-85006014549 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/21086 | - |
dc.identifier.url | http://www.nature.com/articles/srep38724 | - |
dc.identifier.wosid | 000389490300001 | - |
dc.language | 영어 | - |
dc.publisher | NATURE PUBLISHING GROUP | - |
dc.title | Depth resolved lattice-charge coupling in epitaxial BiFeO3 thin film | - |
dc.type | Article | - |
dc.description.isOpenAccess | TRUE | - |
dc.relation.journalWebOfScienceCategory | Multidisciplinary Sciences | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | STRAIN RELAXATION | - |
dc.subject.keywordPlus | POLARIZATION | - |
dc.subject.keywordPlus | THICKNESS | - |
dc.subject.keywordPlus | INTERFACE | - |
dc.subject.keywordPlus | FERROELECTRICITY | - |
dc.subject.keywordPlus | GRADIENTS | - |
dc.subject.keywordPlus | FIELD | - |
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