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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 4743 | - |
dc.citation.number | 22 | - |
dc.citation.startPage | 4739 | - |
dc.citation.title | JOURNAL OF PHYSICAL CHEMISTRY LETTERS | - |
dc.citation.volume | 7 | - |
dc.contributor.author | Choi, Jae Hong | - |
dc.contributor.author | Lee, Junghyun | - |
dc.contributor.author | Moon, Seung Min | - |
dc.contributor.author | Kim, Yun-Tae | - |
dc.contributor.author | Park, Hyesung | - |
dc.contributor.author | Lee, Chang Young | - |
dc.date.accessioned | 2023-12-21T23:07:26Z | - |
dc.date.available | 2023-12-21T23:07:26Z | - |
dc.date.created | 2016-12-16 | - |
dc.date.issued | 2016-11 | - |
dc.description.abstract | Scanning electron microscopy (SEM) is a principal tool for studying nanomaterials, including carbon nanotubes and graphene. Imaging carbon nanomaterials by SEM, however, increases the disorder mode (D-mode) in their Raman spectra. Early studies, which relied on ambiguous ensemble measurements, claimed that the D-mode indicates damage to the specimens by a low-energy electron beam (e-beam). This claim has been accepted by the nanomaterials community for more than a decade without thorough examination. Here we demonstrate that a low-energy e-beam does not damage carbon nanomaterials. By performing measurements on single nanotubes, we independently examined the following factors: (1) the e-beam irradiation itself, (2) the e-beam-deposited hydrocarbon, and (3) the amorphous carbon deposited during synthesis of the material. We concluded that the e-beam-induced D-mode of both carbon nanotubes and graphene originates solely from the irradiated amorphous carbon and not from the e-beam itself or the hydrocarbon. The results of this study should help minimize potential ambiguities for researchers imaging a broad range of nanomaterials by electron microscopy | - |
dc.identifier.bibliographicCitation | JOURNAL OF PHYSICAL CHEMISTRY LETTERS, v.7, no.22, pp.4739 - 4743 | - |
dc.identifier.doi | 10.1021/acs.jpclett.6b02185 | - |
dc.identifier.issn | 1948-7185 | - |
dc.identifier.scopusid | 2-s2.0-84996559734 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/21028 | - |
dc.identifier.url | http://pubs.acs.org/doi/abs/10.1021/acs.jpclett.6b02185 | - |
dc.identifier.wosid | 000388433200049 | - |
dc.language | 영어 | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.title | A Low-Energy Electron Beam Does Not Damage Single-Walled Carbon Nanotubes and Graphene | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Atomic, Molecular & Chemical | - |
dc.relation.journalResearchArea | Chemistry; Science & Technology - Other Topics; Materials Science; Physics | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | RAMAN-SPECTROSCOPY | - |
dc.subject.keywordPlus | INDUCED DEFECTS | - |
dc.subject.keywordPlus | IRRADIATION | - |
dc.subject.keywordPlus | ARRAYS | - |
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