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DC Field | Value | Language |
---|---|---|
dc.citation.number | 2 | - |
dc.citation.startPage | 023108 | - |
dc.citation.title | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
dc.citation.volume | 87 | - |
dc.contributor.author | Arutunian, S. G. | - |
dc.contributor.author | Chung, Moses | - |
dc.contributor.author | Harutyunyan, G. S. | - |
dc.contributor.author | Margaryan, A. V. | - |
dc.contributor.author | Lazareva, E. G. | - |
dc.contributor.author | Lazarev, L. M. | - |
dc.contributor.author | Shahinyan. L. A. | - |
dc.date.accessioned | 2023-12-22T00:09:11Z | - |
dc.date.available | 2023-12-22T00:09:11Z | - |
dc.date.created | 2016-11-08 | - |
dc.date.issued | 2016-02 | - |
dc.description.abstract | We propose a new type of wire scanner for beam profile measurements, based on the use of a vibrating wire as a scattering target. Synchronous measurements with the wire oscillation allow to detect only the signal coming from the scattering of the beam on the wire. This resonant method enables fast beam profiling in the presence of a high level of background. The developed wire scanner, called resonant target vibrating wire scanner, is applied to photon beam profiling, in which the photons reflected on the wire are measured by a fast photodiode. In addition, the proposed measurement principle is expected to monitor other types of beams as well, such as neutrons, protons, electrons, and ions. | - |
dc.identifier.bibliographicCitation | REVIEW OF SCIENTIFIC INSTRUMENTS, v.87, no.2, pp.023108 | - |
dc.identifier.doi | 10.1063/1.4941837 | - |
dc.identifier.issn | 0034-6748 | - |
dc.identifier.scopusid | 2-s2.0-85019670276 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/20694 | - |
dc.identifier.url | http://scitation.aip.org/content/aip/journal/rsi/87/2/10.1063/1.4941837 | - |
dc.identifier.wosid | 000371740900223 | - |
dc.language | 영어 | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Fast resonant target vibrating wire scanner for photon beam | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation; Physics, Applied | - |
dc.relation.journalResearchArea | Instruments & Instrumentation; Physics | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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