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김건호

Kim, Gun-Ho
SoftHeat Lab.
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dc.citation.endPage 85028 -
dc.citation.number 8 -
dc.citation.startPage 85028 -
dc.citation.title PHYSICAL REVIEW B -
dc.citation.volume 86 -
dc.contributor.author Kim, Gun-Ho -
dc.contributor.author Pipe, Kevin -
dc.date.accessioned 2023-12-22T04:46:15Z -
dc.date.available 2023-12-22T04:46:15Z -
dc.date.created 2016-05-19 -
dc.date.issued 2012-08 -
dc.description.abstract A model for the Seebeck coefficient in the regime of hopping transport that includes the effects of Gaussian carrier density of states width and carrier localization allows these parameters to be derived independently of the attempt-to-jump rate, which can subsequently be derived from measured electrical conductivity. This model is applied to prototypical small molecular and polymer organic semiconductors to characterize carrier localization, quantify the role of dopants on the hopping transport parameters, and derive the effective dopant ionization fraction and activation energy. -
dc.identifier.bibliographicCitation PHYSICAL REVIEW B, v.86, no.8, pp.85028 - 85028 -
dc.identifier.doi 10.1103/PhysRevB.86.085208 -
dc.identifier.issn 1098-0121 -
dc.identifier.scopusid 2-s2.0-84865680692 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/19203 -
dc.identifier.url http://journals.aps.org/prb/abstract/10.1103/PhysRevB.86.085208 -
dc.identifier.wosid 000308128500002 -
dc.language 영어 -
dc.publisher AMER PHYSICAL SOC -
dc.title Thermoelectric model to characterize carrier transport in organic semiconductors -
dc.type Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -

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