dc.citation.endPage |
S13 |
- |
dc.citation.number |
6 |
- |
dc.citation.startPage |
S8 |
- |
dc.citation.title |
Microscopy and Analysis |
- |
dc.citation.volume |
29 |
- |
dc.contributor.author |
Lee, Zonghoon |
- |
dc.date.accessioned |
2023-12-22T00:37:02Z |
- |
dc.date.available |
2023-12-22T00:37:02Z |
- |
dc.date.created |
2016-01-12 |
- |
dc.date.issued |
2015-11 |
- |
dc.description.abstract |
We review recent observations in our laboratory using atomic-resolution transmission electron microscopy (TEM), focusing on three two–dimensional (2D) materials, graphene, hexagonal boron nitride, and molybdenum tungsten disulfide – a conductor, an insulator, and a semiconductor, respectively. In all cases the atomic scale TEM observations contributed critical information to our efforts to understand the structure, defect formation, and synthesis of these fascinating 2D materials. |
- |
dc.identifier.bibliographicCitation |
Microscopy and Analysis, v.29, no.6, pp.S8 - S13 |
- |
dc.identifier.issn |
2043-063 |
- |
dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/18153 |
- |
dc.language |
영어 |
- |
dc.publisher |
Wiley |
- |
dc.title |
Recent observations of structure, in situ defect formation, and synthesis of 2D materials using atomic-resolution TEM |
- |
dc.type |
Article |
- |
dc.description.isOpenAccess |
FALSE |
- |
dc.description.journalRegisteredClass |
foreign |
- |