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김태성

Kim, Taesung
Microfluidics & Nanomechatronics Lab.
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dc.citation.endPage 9479 -
dc.citation.number 18 -
dc.citation.startPage 9461 -
dc.citation.title NANOSCALE -
dc.citation.volume 8 -
dc.contributor.author Kim, Minseok -
dc.contributor.author Kim, Dong-Joo -
dc.contributor.author Ha, Dogyeong -
dc.contributor.author Kim, Taesung -
dc.date.accessioned 2023-12-21T23:46:37Z -
dc.date.available 2023-12-21T23:46:37Z -
dc.date.created 2016-01-11 -
dc.date.issued 2016-05 -
dc.description.abstract Cracks are frequently observed in daily life, but they are rarely welcome and are considered as a material failure mode. Interestingly, cracks cause critical problems in various micro/nanofabrication processes such as colloidal assembly, thin film deposition, and even standard photolithography because they are hard to avoid or control. However, increasing attention has been given recently to control and use cracks as a facile, low-cost strategy for producing highly ordered nanopatterns. Specifically, cracking is the breakage of molecular bonds and occurs simultaneously over a large area, enabling fabrication of nanoscale patterns at both high resolution and high throughput, which are difficult to obtain simultaneously using conventional nanofabrication techniques. In this review, we discuss various cracking-assisted nanofabrication techniques, referred to as crack lithography, and summarize the fabrication principles, procedures, and characteristics of the crack patterns such as their position, direction, and dimensions. First, we categorize crack lithography techniques into three technical development levels according to the directional freedom of the crack patterns: randomly oriented, unidirectional, or multidirectional. Then, we describe a wide range of novel practical devices fabricated by crack lithography, including bioassay platforms, nanofluidic devices, nanowire sensors, and even biomimetic mechanosensors. -
dc.identifier.bibliographicCitation NANOSCALE, v.8, no.18, pp.9461 - 9479 -
dc.identifier.doi 10.1039/C5NR06266G -
dc.identifier.issn 2040-3364 -
dc.identifier.scopusid 2-s2.0-84971673856 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/18111 -
dc.identifier.url http://pubs.rsc.org/en/Content/ArticleLanding/2015/NR/C5NR06266G#!divAbstract -
dc.identifier.wosid 000375799900001 -
dc.language 영어 -
dc.publisher ROYAL SOC CHEMISTRY -
dc.title Cracking-assisted Fabrication of Nanoscale Patterns for Micro/Nanotechnological Applications -
dc.type Article -
dc.description.isOpenAccess TRUE -
dc.relation.journalWebOfScienceCategory Chemistry, Multidisciplinary; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied -
dc.relation.journalResearchArea Chemistry; Science & Technology - Other Topics; Materials Science; Physics -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus ELECTRON-BEAM LITHOGRAPHY -
dc.subject.keywordPlus THIN-FILMS -
dc.subject.keywordPlus SOFT LITHOGRAPHY -
dc.subject.keywordPlus FLUIDIC CHANNELS -
dc.subject.keywordPlus RECENT PROGRESS -
dc.subject.keywordPlus NANOWIRES -
dc.subject.keywordPlus FRACTURE -
dc.subject.keywordPlus NANOCHANNELS -
dc.subject.keywordPlus DEVICES -
dc.subject.keywordPlus SENSORS -

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