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Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Laboratory (IC & EMC Lab)
Research Interests
  • Convergence between circuit and EM domains

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An Enhanced Statistical Analysis Method for I/O Links Considering Supply Voltage Fluctuations and Inter-Symbol-Interference

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dc.contributor.author Kim, Jingook ko
dc.contributor.author Lee, Jongjoo ko
dc.contributor.author Park, Eunkyeong ko
dc.contributor.author Park, Youngwoo ko
dc.date.available 2015-10-05T00:06:51Z -
dc.date.created 2015-09-03 ko
dc.date.issued 2015-08 ko
dc.identifier.citation IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.5, no.8, pp.1129 - 1141 ko
dc.identifier.issn 2156-3950 ko
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/17207 -
dc.description.abstract Statistical link analysis methods were previously developed for effective computation of bit error rate due to intersymbol interference (ISI). In addition to ISI, supply voltage fluctuations at output drivers can cause jitter and amplitude uncertainty in I/O links. In this paper, the enhanced statistical link analysis method considering both ISI and supply voltage fluctuations is clearly reformulated and experimentally validated step by step by various measurements. A silicon integrated circuit (IC) is designed, fabricated, and assembled on a manufactured printed circuit board (PCB). The supply voltage fluctuations on the IC with regard to the receiver reference voltage are extracted from measurements at the IC and PCB. Also, the impulse response of the total output channel is extracted from the measurements of the driver and channel characteristics. The statistical eye diagrams of the channel output including both ISI effects and the supply voltage fluctuations are then calculated and validated by comparison with the direct eye measurements. ko
dc.description.statementofresponsibility close -
dc.language 영어 ko
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC ko
dc.title An Enhanced Statistical Analysis Method for I/O Links Considering Supply Voltage Fluctuations and Inter-Symbol-Interference ko
dc.type ARTICLE ko
dc.identifier.scopusid 2-s2.0-85027923925 ko
dc.identifier.wosid 000360018200011 ko
dc.type.rims ART ko
dc.description.wostc 0 *
dc.description.scopustc 0 *
dc.date.tcdate 2015-12-28 *
dc.date.scptcdate 2015-11-04 *
dc.date.scptcdate 2015-11-04 *
dc.identifier.doi 10.1109/TCPMT.2015.2450723 ko
dc.identifier.url http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=7173030&sortType%3Dasc_p_Sequence%26filter%3DAND(p_Publication_Number%3A5503870)%26rowsPerPage%3D100 ko
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