Use of a Linear Paul Trap to Study Random Noise-Induced Beam Degradation in High-Intensity Accelerators

Abstract

A random noise-induced beam degradation that can affect intense beam transport over long propagation distances has been experimentally studied by making use of the transverse beam dynamics equivalence between an alternating-gradient (AG) focusing system and a linear Paul trap system. For the present studies, machine imperfections in the quadrupole focusing lattice are considered, which are emulated by adding small random noise on the voltage waveform of the quadrupole electrodes in the Paul trap. It is observed that externally driven noise continuously produces a nonthermal tail of trapped ions, and increases the transverse emittance almost linearly with the duration of the noise.