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Chung, Moses
Intense Beam and Accelerator Lab.
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DC Field Value Language
dc.citation.number 5 -
dc.citation.title PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS -
dc.citation.volume 12 -
dc.contributor.author Chung, Moses -
dc.contributor.author Gilson, Erik P. -
dc.contributor.author Davidson, Ronald C. -
dc.contributor.author Efthimion, Philip C. -
dc.contributor.author Majeski, Richard -
dc.date.accessioned 2023-12-22T08:06:41Z -
dc.date.available 2023-12-22T08:06:41Z -
dc.date.created 2015-09-14 -
dc.date.issued 2009-05 -
dc.description.abstract A random noise-induced beam degradation that could affect intense beam transport over long propagation distances has been experimentally investigated by making use of the transverse beam dynamics equivalence between an alternating-gradient focusing system and a linear Paul trap system. For the present study, machine imperfections in the quadrupole focusing lattice are considered, which are emulated by adding small random noise on the voltage waveform of the quadrupole electrodes in the Paul trap. It is observed that externally driven noise continuously increases the rms radius, transverse emittance, and nonthermal tail of the trapped charge bunch almost linearly with the duration of the noise. The combined effects of collective modes and colored noise are also investigated and compared with numerical simulations -
dc.identifier.bibliographicCitation PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, v.12, no.5 -
dc.identifier.doi 10.1103/PhysRevSTAB.12.054203 -
dc.identifier.issn 1098-4402 -
dc.identifier.scopusid 2-s2.0-66649104254 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/16878 -
dc.identifier.url http://journals.aps.org/prstab/abstract/10.1103/PhysRevSTAB.12.054203 -
dc.identifier.wosid 000266697700016 -
dc.language 영어 -
dc.publisher AMER PHYSICAL SOC -
dc.title Experimental investigation of random noise-induced beam degradation in high-intensity accelerators using a linear Paul trap -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -

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