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Sim, Jae-Young
Visual Information Processing Lab (VIP Lab)
Research Interests
  • Image processing, computer vision, 3D visual processing, signal processing

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FDQM: fast quality metric for depth maps without view synthesis

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dc.contributor.author Jang, Won-Dong ko
dc.contributor.author Chung, Tae-Young ko
dc.contributor.author Sim, Jae-Young ko
dc.contributor.author Kim, Chang-Su ko
dc.date.available 2015-07-29T00:53:17Z -
dc.date.created 2015-07-24 ko
dc.date.issued 2015-07 ko
dc.identifier.citation IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY, v.25, no.7, pp.1099 - 1112 ko
dc.identifier.issn 1051-8215 ko
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/12768 -
dc.description.abstract We propose a fast quality metric for depth maps, called fast depth quality metric (FDQM), which efficiently evaluates the impacts of depth map errors on the qualities of synthesized intermediate views in multiview video plus depth applications. In other words, the proposed FDQM assesses view synthesis distortions in the depth map domain, without performing the actual view synthesis. First, we estimate the distortions at pixel positions, which are specified by reference disparities and distorted disparities, respectively. Then, we integrate those pixel-wise distortions into an FDQM score by employing a spatial pooling scheme, which considers occlusion effects and the characteristics of human visual attention. As a benchmark of depth map quality assessment, we perform a subjective evaluation test for intermediate views, which are synthesized from compressed depth maps at various bitrates. We compare the subjective results with objective metric scores. Experimental results demonstrate that the proposed FDQM yields highly correlated scores to the subjective ones. Moreover, FDQM requires at least 10 times less computations than conventional quality metrics, since it does not perform the actual view synthesis. ko
dc.description.statementofresponsibility close -
dc.language 영어 ko
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC ko
dc.title FDQM: fast quality metric for depth maps without view synthesis ko
dc.type ARTICLE ko
dc.identifier.scopusid 2-s2.0-84936774635 ko
dc.identifier.wosid 000357616600002 ko
dc.type.rims ART ko
dc.description.wostc 0 *
dc.description.scopustc 0 *
dc.date.tcdate 2015-12-28 *
dc.date.scptcdate 2015-11-04 *
dc.identifier.doi 10.1109/TCSVT.2014.2372343 ko
dc.identifier.url http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6963368 ko
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